Inventor · disambiguated record
Gow-Wei Sun
Also filed as: SUN GOW-WEI
3 granted patents·3 pending applications·18 citations·filing 2000–2002
63Inventor score
Files withUNITED MICROELECTRONICS CORP4
Top patents by PatentIndex Score
6 records- 0162US6410422B1Method of forming a local interconnect contact openingUNITED MICROELECTRONICS CORP·Filed 2000·Granted Jun 25, 2002·11 cites·6 claims
- 0253US6509228B1Etching procedure for floating gate formation of a flash memory deviceUNITED MICROELECTRONICS CORP·Filed 2000·Granted Jan 21, 2003·7 cites·23 claims
- 0329US6479307B2Method of monitoring loss of silicon nitrideUNITED MICROELECTRONICS CORP·Filed 2001·Granted Nov 12, 2002·0 cites·10 claims
- 0429US2002182864A1Etching processUNITED MICROELECTRONICS CORP·Filed 2001·Application pending·0 cites
- 0529US2003022513A1Polymer debris pre-cleaning methodFiled 2002·Application pending·0 cites
- 0626US2003082905A1Method for forming a uniform damascene profileFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →