Inventor · disambiguated record
Edward Yin
Also filed as: YIN EDWARD · YIN EDWARD M
9 granted patents·2 pending applications·478 citations·filing 2001–2012
91Inventor score
Top patents by PatentIndex Score
11 records- 0198US6844550B1Multi-beam multi-column electron beam inspection systemMULTIBEAM SYSTEMS INC·Filed 2003·Granted Jan 18, 2005·142 cites·17 claims
- 0296US6617587B2Electron optics for multi-beam electron beam lithography toolMULTIBEAM SYSTEMS INC·Filed 2002·Granted Sep 9, 2003·104 cites·6 claims
- 0393US8975668B2Backside-thinned image sensor using Al2 O3 surface passivationCOSTELLO KENNETH A·Filed 2012·Granted Mar 10, 2015·37 cites·16 claims
- 0493US7005637B2Backside thinning of image array devicesINTEVAC INC·Filed 2004·Granted Feb 28, 2006·64 cites·3 claims
- 0593US6977375B2Multi-beam multi-column electron beam inspection systemMULTIBEAM SYSTEMS INC·Filed 2001·Granted Dec 20, 2005·47 cites·29 claims
- 0690US6777675B2Detector optics for electron beam inspection systemMULTIBEAM·Filed 2002·Granted Aug 17, 2004·55 cites·19 claims
- 0785US8698925B2Collimator bonding structure and methodCOSTELLO KENNETH A·Filed 2010·Granted Apr 15, 2014·5 cites·32 claims
- 0881US7479686B2Backside imaging through a doped layerINTEVAC INC·Filed 2005·Granted Jan 20, 2009·5 cites·7 claims
- 0975US7042060B2Backside thinning of image array devicesINTEVAC INC·Filed 2004·Granted May 9, 2006·19 cites·40 claims
- 1041US2004119021A1Electron optics for multi-beam electron beam lithography toolION DIAGNOSTICS·Filed 2003·Application pending·0 cites
- 1138US2004169248A1Backside thinning of image array devicesINTEVAC INC·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →