Inventor · disambiguated record
Nalan Liv Hamarat
Also filed as: LIV HAMARAT NALAN
2 granted patents·4 citations·filing 2015–2015
44Inventor score
Technology areasH01J
Top patents by PatentIndex Score
2 records- 0181US10651009B2Method for inspecting a sample using an assembly comprising a scanning electron microscope and a light microscopeDELMIC B V·Filed 2015·Granted May 12, 2020·4 cites·34 claims
- 0246USRE50540EMethod for inspecting a sample using an assembly comprising a scanning electron microscope and a light microscopeDELMIC IP B V·Filed 2015·Granted Aug 19, 2025·0 cites·37 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →