Inventor · disambiguated record
Joong-Wuk Kang
Also filed as: KANG JOONG WUK
2 granted patents·10 citations·filing 2006–2016
55Inventor score
Top patents by PatentIndex Score
2 records- 0175US7514949B2Testing method detecting localized failure on a semiconductor waferSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Apr 7, 2009·7 cites·26 claims
- 0269US9773287B1Weapon management system using police officer black-box, method and apparatus for police officer black-boxBASE KOREA INFORMATION COMMUNICATION CO LTD·Filed 2016·Granted Sep 26, 2017·3 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →