Inventor · disambiguated record
Troy J. Perry
Also filed as: PERRY TROY · PERRY TROY J · PERRY TROY JOSEPH
13 granted patents·2 pending applications·94 citations·filing 2006–2017
90Inventor score
Top patents by PatentIndex Score
15 records- 0192US7170299B1Electronic fuse blow mimic and methods for adjusting electronic fuse blowIBM·Filed 2006·Granted Jan 30, 2007·25 cites·20 claims
- 0288US7512915B2Embedded test circuit for testing integrated circuits at the die levelIBM·Filed 2007·Granted Mar 31, 2009·14 cites·19 claims
- 0386US7382149B2System for acquiring device parametersIBM·Filed 2006·Granted Jun 3, 2008·15 cites·20 claims
- 0485US7653888B2System for and method of integrating test structures into an integrated circuitIBM·Filed 2007·Granted Jan 26, 2010·15 cites·20 claims
- 0576US9653330B1Threshold voltage (VT)-type transistor sensitive and/or fan-out sensitive selective voltage binningGLOBALFOUNDRIES INC·Filed 2016·Granted May 16, 2017·2 cites·20 claims
- 0671US7518899B2Method of providing optimal field programming of electronic fusesIBM·Filed 2006·Granted Apr 14, 2009·8 cites·8 claims
- 0768US7884599B2HDL design structure for integrating test structures into an integrated circuit designIBM·Filed 2008·Granted Feb 8, 2011·5 cites·10 claims
- 0863US7791972B2Design structure for providing optimal field programming of electronic fusesIBM·Filed 2007·Granted Sep 7, 2010·7 cites·14 claims
- 0962US8963566B2Thermally adaptive in-system allocationIBM·Filed 2012·Granted Feb 24, 2015·1 cites·12 claims
- 1057US10295592B2Pre-test power-optimized bin reassignment following selective voltage binningGLOBALFOUNDRIES INC·Filed 2017·Granted May 21, 2019·0 cites·17 claims
- 1154US8570820B2Selectable repair pass maskingGORMAN KEVIN WILLIAM·Filed 2011·Granted Oct 29, 2013·2 cites·20 claims
- 1252US9759767B2Pre-test power-optimized bin reassignment following selective voltage binningGLOBALFOUNDRIES INC·Filed 2015·Granted Sep 12, 2017·0 cites·11 claims
- 1343US9514999B2Systems and methods for semiconductor line scribe line centeringIBM·Filed 2013·Granted Dec 6, 2016·0 cites·20 claims
- 1435US2008222584A1Method in a Computer-aided Design System for Generating a Functional Design Model of a Test StructureHABIB NAZMUL·Filed 2008·Application pending·0 cites
- 1534US2009083690A1System for and method of integrating test structures into an integrated circuitHABIB NAZMUL·Filed 2007·Application pending·0 cites
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