Inventor · disambiguated record
Kyoko Izuha
Also filed as: IZUHA KYOKO
43 granted patents·5 pending applications·347 citations·filing 2000–2020
97Inventor score
Top patents by PatentIndex Score
48 records- 0194US6440616B1Mask and method for focus monitoringTOSHIBA KK·Filed 2000·Granted Aug 27, 2002·63 cites·26 claims
- 0291US9177984B2Solid-state imaging device and electronic apparatus having a solid-state imaging deviceIZUHA KYOKO·Filed 2012·Granted Nov 3, 2015·8 cites·21 claims
- 0391US7194704B2Design layout preparing methodTOSHIBA KK·Filed 2004·Granted Mar 20, 2007·61 cites·16 claims
- 0489US8558158B2Solid-state imaging device, manufacturing method and designing method thereof, and electronic deviceIZUHA KYOKO·Filed 2010·Granted Oct 15, 2013·6 cites·15 claims
- 0587US7571417B2Method and system for correcting a mask pattern designTOSHIBA KK·Filed 2004·Granted Aug 4, 2009·23 cites·14 claims
- 0687US6741334B2Exposure method, exposure system and recording mediumTOSHIBA KK·Filed 2001·Granted May 25, 2004·28 cites·14 claims
- 0785US9846317B2Optical modulator, imaging device and display apparatus including a dielectric layer and an electrode comprising grapheneSONY CORP·Filed 2013·Granted Dec 19, 2017·4 cites·17 claims
- 0885US8847135B2Solid-state imaging device, driving method thereof and electronic apparatusIZUHA KYOKO·Filed 2011·Granted Sep 30, 2014·5 cites·7 claims
- 0985US8078996B2Method and system for correcting a mask pattern designIZUHA KYOKO·Filed 2009·Granted Dec 13, 2011·6 cites·7 claims
- 1085US6667139B2Method of manufacturing semiconductor deviceTOSHIBA KK·Filed 2002·Granted Dec 23, 2003·35 cites·20 claims
- 1184US7925090B2Method of determining photo mask, method of manufacturing semiconductor device, and computer program productTOSHIBA KK·Filed 2006·Granted Apr 12, 2011·7 cites·14 claims
- 1284US7788626B2Pattern data correction method, pattern checking method, pattern check program, photo mask producing method, and semiconductor device manufacturing methodTOSHIBA KK·Filed 2005·Granted Aug 31, 2010·7 cites·7 claims
- 1383US8185856B2Manufacturing method, manufacturing program and manufacturing system for adjusting signal delay in a semiconductor deviceIZUHA KYOKO·Filed 2009·Granted May 22, 2012·11 cites·14 claims
- 1481US8381160B2Manufacturing method, manufacturing program and manufacturing system for semiconductor deviceSONY CORP·Filed 2011·Granted Feb 19, 2013·5 cites·6 claims
- 1579US7784020B2Semiconductor circuit pattern design method for manufacturing semiconductor device or liquid crystal display deviceTOSHIBA KK·Filed 2006·Granted Aug 24, 2010·8 cites·6 claims
- 1678US9786410B2Transparent conductive film, heater, touch panel, solar battery, organic EL device, liquid crystal device, and electronic paperSHIMIZU KEISUKE·Filed 2012·Granted Oct 10, 2017·3 cites·18 claims
- 1777US9419157B2Solid-state imaging device, manufacturing method and designing method thereof, and electronic deviceSONY CORP·Filed 2013·Granted Aug 16, 2016·1 cites·11 claims
- 1877US8605175B2Solid-state image capturing device including a photochromic film having a variable light transmittance, and electronic device including the solid-state image capturing deviceIZUHA KYOKO·Filed 2011·Granted Dec 10, 2013·1 cites·14 claims
- 1977US7250235B2Focus monitor method and maskTOSHIBA KK·Filed 2004·Granted Jul 31, 2007·15 cites·24 claims
- 2076US10506182B2Imaging device and pixel signal reading methodSONY SEMICONDUCTOR SOLUTIONS CORP·Filed 2015·Granted Dec 10, 2019·2 cites·12 claims
- 2176US9438834B2Solid-state imaging device, driving method thereof and electronic apparatusSONY CORP·Filed 2014·Granted Sep 6, 2016·2 cites·19 claims
- 2275US7631287B2Calculating method, verification method, verification program and verification system for edge deviation quantity, and semiconductor device manufacturing methodTOSHIBA KK·Filed 2007·Granted Dec 8, 2009·3 cites·6 claims
- 2374US7108945B2Photomask having a focus monitor patternTOSHIBA KK·Filed 2003·Granted Sep 19, 2006·16 cites·25 claims
- 2473US10598966B2Light control device, imaging element, and imaging device, and light transmittance control method for light control deviceSONY SEMICONDUCTOR SOLUTIONS CORP·Filed 2019·Granted Mar 24, 2020·0 cites·6 claims
- 2571US9219090B2Solid-state image capturing device and electronic deviceSONY CORP·Filed 2013·Granted Dec 22, 2015·0 cites·19 claims
- 2669US9064983B2Solid-state imaging device and electronic equipmentSONY CORP·Filed 2014·Granted Jun 23, 2015·1 cites·18 claims
- 2768US8028267B2Pattern designing method, pattern designing program and pattern designing apparatusSONY CORP·Filed 2008·Granted Sep 27, 2011·3 cites·6 claims
- 2867US7094504B2Mask, manufacturing method for mask, and manufacturing method for semiconductor deviceTOSHIBA KK·Filed 2003·Granted Aug 22, 2006·7 cites·29 claims
- 2966US7851236B2Film thickness prediction method, layout design method, mask pattern design method of exposure mask, and fabrication method of semiconductor integrated circuitSONY CORP·Filed 2009·Granted Dec 14, 2010·2 cites·11 claims
- 3065US8490031B2Method, apparatus and program for adjusting feature dimensions to compensate for planarizing effects in the generation of mask data and manufacturing semiconductor deviceIZUHA KYOKO·Filed 2010·Granted Jul 16, 2013·2 cites·12 claims
- 3164US7200833B2Calculating method, verification method, verification program and verification system for edge deviation quantity, and semiconductor device manufacturing methodTOSHIBA KK·Filed 2004·Granted Apr 3, 2007·6 cites·10 claims
- 3262US10895763B2Light control device, imaging element, and imaging device, and light transmittance control method for light control deviceSONY SEMICONDUCTOR SOLUTIONS CORP·Filed 2020·Granted Jan 19, 2021·0 cites·5 claims
- 3362US10324317B2Light control device, imaging element, and imaging device, and light transmittance control method for light control deviceSONY CORP·Filed 2014·Granted Jun 18, 2019·0 cites·11 claims
- 3462US8112724B2Method of designing semiconductor integrated circuit, apparatus for designing semiconductor integrated circuit, recording medium, and mask manufacturing methodIZUHA KYOKO·Filed 2008·Granted Feb 7, 2012·2 cites·33 claims
- 3554US10381395B2Light control device with stacked light control layersSONY CORP·Filed 2014·Granted Aug 13, 2019·0 cites·20 claims
- 3654US2012054695A1Pattern Verification Method, Pattern Verification System, Mask Manufacturing Method and Semiconductor Device Manufacturing MethodIZUHA KYOKO·Filed 2011·Application pending·0 cites
- 3753US7541136B2Mask, manufacturing method for mask, and manufacturing method for semiconductor deviceTOSHIBA KK·Filed 2006·Granted Jun 2, 2009·0 cites·15 claims
- 3852US8754968B2Solid-state imaging device and electronic equipmentIZUHA KYOKO·Filed 2011·Granted Jun 17, 2014·0 cites·20 claims
- 3950US9761628B2Imaging element and imaging deviceSONY CORP·Filed 2014·Granted Sep 12, 2017·0 cites·13 claims
- 4049US8839158B2Pattern designing method, pattern designing program and pattern designing apparatusIZUHA KYOKO·Filed 2011·Granted Sep 16, 2014·0 cites·4 claims
- 4149US2009183132A1Semiconductor-device manufacturing method, semiconductor-device manufacturing program and semiconductor-device manufacturing systemSONY CORP·Filed 2009·Application pending·0 cites
- 4247US2013334402A1Solid-state imagingelement, calibration method of solid-state imagingelement, shutter device, and electronic apparatusSONY CORP·Filed 2013·Application pending·0 cites
- 4347US2011041104A1Semiconductor circuit pattern design method for manufacturing semiconductor device or liquid crystal display deviceTOSHIBA KK·Filed 2010·Application pending·0 cites
- 4446US2009291512A1Semiconductor device pattern verification method, semiconductor device pattern verification program, and semiconductor device manufacturing methodIZUHA KYOKO·Filed 2009·Application pending·0 cites
- 4545US10602084B2Imaging apparatus which performs compressive sensing reading data for a partitioned block output from an image sensorSONY CORP·Filed 2016·Granted Mar 24, 2020·0 cites·19 claims
- 4642US7371483B2Method for manufacturing mask for focus monitoring, and method for manufacturing semiconductor deviceTOSHIBA KK·Filed 2004·Granted May 13, 2008·4 cites·9 claims
- 4741US9435643B2Presumably defective portion decision apparatus, presumably defective portion decision method, fabrication method for semiconductor device and programSONY CORP·Filed 2013·Granted Sep 6, 2016·0 cites·15 claims
- 4838US10163776B2Designing method of capacitive element in multilayer wirings for integrated circuit devices based on statistical processIZUHA KYOKO·Filed 2010·Granted Dec 25, 2018·0 cites·17 claims
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