Inventor · disambiguated record
Yukihisa Mohara
Also filed as: MOHARA YUKIHISA
10 granted patents·2 pending applications·44 citations·filing 2005–2020
86Inventor score
Top patents by PatentIndex Score
12 records- 0195US7369223B2Method of apparatus for detecting particles on a specimenHITACHI HIGH TECH CORP·Filed 2005·Granted May 6, 2008·25 cites·5 claims
- 0286US10458924B2Inspection apparatus and inspection methodHITACHI HIGH TECH CORP·Filed 2016·Granted Oct 29, 2019·3 cites·8 claims
- 0383US7733473B2Inspection apparatus and inspection methodHITACHI HIGH TECH CORP·Filed 2008·Granted Jun 8, 2010·6 cites·14 claims
- 0479US8289507B2Method of apparatus for detecting particles on a specimenHAMAMATSU AKIRA·Filed 2011·Granted Oct 16, 2012·2 cites·12 claims
- 0579US7817261B2Method of apparatus for detecting particles on a specimenHITACHI HIGH TECH CORP·Filed 2008·Granted Oct 19, 2010·4 cites·14 claims
- 0678US7952700B2Method of apparatus for detecting particles on a specimenHITACHI HIGH TECH CORP·Filed 2010·Granted May 31, 2011·2 cites·12 claims
- 0757US12276618B2Defect inspection deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Apr 15, 2025·0 cites·9 claims
- 0856US9097686B2Optical type inspection apparatus, inspection system and the wafer for coordinates managementBAMBA YOSHIO·Filed 2012·Granted Aug 4, 2015·2 cites·13 claims
- 0954US8525984B2Inspection apparatus and inspection methodYAMASHITA HIROYUKI·Filed 2012·Granted Sep 3, 2013·0 cites·10 claims
- 1051US7999932B2Inspection apparatus and inspection methodHITACHI HIGH TECH CORP·Filed 2010·Granted Aug 16, 2011·0 cites·10 claims
- 1151US2011285989A1Inspection apparatus and inspection methodYAMASHITA HIROYUKI·Filed 2011·Application pending·0 cites
- 1242US2013194579A1Inspection apparatusMOHARA YUKIHISA·Filed 2011·Application pending·0 cites
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