Inventor · disambiguated record
Jason Mcnichols
Also filed as: MCNICHOLS JASON · MCNICHOLS JASON W
3 granted patents·36 citations·filing 2003–2004
68Inventor score
Top patents by PatentIndex Score
3 records- 0181US7968859B2Wafer edge defect inspection using captured image analysisLSI CORP·Filed 2003·Granted Jun 28, 2011·27 cites·10 claims
- 0265US7312880B2Wafer edge structure measurement methodLSI CORP·Filed 2004·Granted Dec 25, 2007·7 cites·12 claims
- 0341US7315360B2Surface coordinate systemLSI LOGIC CORP·Filed 2004·Granted Jan 1, 2008·2 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →