Inventor · disambiguated record
Patrick Lomtscher
Also filed as: LOMTSCHER PATRICK
2 granted patents·4 pending applications·2 citations·filing 2005–2020
34Inventor score
Top patents by PatentIndex Score
6 records- 0177US11092901B2Wafer exposure method using wafer models and wafer fabrication assemblyQONIAC GMBH·Filed 2020·Granted Aug 17, 2021·2 cites·20 claims
- 0240US7248351B2Optimizing light path uniformity in inspection systemsINFINEON TECHNOLOGIES AG·Filed 2005·Granted Jul 24, 2007·0 cites·17 claims
- 0332US2009168034A1Methods and Apparatus of Manufacturing a Semiconductor DeviceSTAECKER JENS·Filed 2007·Application pending·0 cites
- 0431US2006194130A1Run to run control for lens aberrationsROBERTS WILLIAM·Filed 2005·Application pending·0 cites
- 0531US2006193531A1System for analyzing images of blazed phase grating samplesROBERTS WILLIAM·Filed 2005·Application pending·0 cites
- 0631US2006192943A1Optimizing focal plane fitting functions for an image field on a substrateROBERTS WILLIAM·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →