Inventor · disambiguated record
Nireekshan K. Reddy
Also filed as: REDDY NIREEKSHAN · REDDY NIREEKSHAN K
7 granted patents·3 pending applications·3 citations·filing 2020–2024
71Inventor score
Files withKLA CORP10
Top patents by PatentIndex Score
10 records- 0192US12001148B2Enhancing performance of overlay metrologyKLA CORP·Filed 2023·Granted Jun 4, 2024·2 cites·26 claims
- 0283US11592755B2Enhancing performance of overlay metrologyKLA CORP·Filed 2021·Granted Feb 28, 2023·1 cites·30 claims
- 0372US2024337952A1System and method for determining overlay measurement of a scanning targetKLA CORP·Filed 2023·Application pending·0 cites
- 0465US2025257992A1Metrology measurements on small targets with control of zero-order side lobesKLA CORP·Filed 2024·Application pending·0 cites
- 0563US12373936B2System and method for overlay metrology using a phase maskKLA CORP·Filed 2023·Granted Jul 29, 2025·0 cites·38 claims
- 0663US12078601B2Universal metrology modelKLA CORP·Filed 2022·Granted Sep 3, 2024·0 cites·38 claims
- 0763US2025297855A1System and method for device-like overlay targets measurementKLA CORP·Filed 2024·Application pending·0 cites
- 0862US12067745B2Image pre-processing for overlay metrology using decomposition techniquesKLA CORP·Filed 2023·Granted Aug 20, 2024·0 cites·23 claims
- 0952US12165930B2Adaptive modeling misregistration measurement system and methodKLA CORP·Filed 2022·Granted Dec 10, 2024·0 cites·22 claims
- 1048US12222199B2Systems and methods for measurement of misregistration and amelioration thereofKLA CORP·Filed 2020·Granted Feb 11, 2025·0 cites·22 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →