Inventor · disambiguated record
Charles E. Stroud
Also filed as: STROUD CHARLES E · STROUD CHARLES EUGENE
18 granted patents·1,031 citations·filing 1986–2005
96Inventor score
Files withLATTICE SEMICONDUCTOR CORP4LUCENT TECHNOLOGIES INC4UNIV NORTH CAROLINA3AT & T BELL LAB2AGERE SYST GUARDIAN CORP1
Top patents by PatentIndex Score
18 records- 0196US6874108B1Fault tolerant operation of reconfigurable devices utilizing an adjustable system clockAGERE SYSTEMS INC·Filed 2002·Granted Mar 29, 2005·98 cites·23 claims
- 0295US6631487B1On-line testing of field programmable gate array resourcesLATTICE SEMICONDUCTOR CORP·Filed 2000·Granted Oct 7, 2003·85 cites·26 claims
- 0395US6202182B1Method and apparatus for testing field programmable gate arraysLUCENT TECHNOLOGIES INC·Filed 1998·Granted Mar 13, 2001·147 cites·21 claims
- 0494US6003150AMethod for testing field programmable gate arraysLUCENT TECHNOLOGIES INC·Filed 1997·Granted Dec 14, 1999·86 cites·15 claims
- 0590US4872168AIntegrated circuit with memory self-testAMERICAN TELEPHONE & TELEGRAPH·Filed 1986·Granted Oct 3, 1989·70 cites·10 claims
- 0688US6973608B1Fault tolerant operation of field programmable gate arraysUNIV NORTH CAROLINA·Filed 2002·Granted Dec 6, 2005·60 cites·36 claims
- 0788US6530049B1On-line fault tolerant operation via incremental reconfiguration of field programmable gate arraysLATTICE SEMICONDUCTOR CORP·Filed 2000·Granted Mar 4, 2003·42 cites·26 claims
- 0887US7428683B2Automatic analog test and compensation with built-in pattern generator and analyzerUNIV AUBURN·Filed 2005·Granted Sep 23, 2008·16 cites·42 claims
- 0986US6966020B1Identifying faulty programmable interconnect resources of field programmable gate arraysUNIV NORTH CAROLINA·Filed 2001·Granted Nov 15, 2005·33 cites·20 claims
- 1085US5991907AMethod for testing field programmable gate arraysLUCENT TECHNOLOGIES INC·Filed 1996·Granted Nov 23, 1999·45 cites·9 claims
- 1185US5230000ABuilt-in self-test (bist) circuitAT & T BELL LAB·Filed 1991·Granted Jul 20, 1993·81 cites·12 claims
- 1284US6256758B1Fault tolerant operation of field programmable gate arraysAGERE SYST GUARDIAN CORP·Filed 1999·Granted Jul 3, 2001·54 cites·12 claims
- 1383US7412343B2Methods for delay-fault testing in field-programmable gate arraysUNIV NORTH CAROLINA·Filed 2003·Granted Aug 12, 2008·37 cites·23 claims
- 1483US6108806AMethod of testing and diagnosing field programmable gate arraysLUCENT TECHNOLOGIES INC·Filed 1998·Granted Aug 22, 2000·43 cites·15 claims
- 1573US6052808AMaintenance registers with Boundary Scan interfaceUNIV KENTUCKY RES FOUND·Filed 1997·Granted Apr 18, 2000·36 cites·21 claims
- 1673US5251208ADigital signal processor synchronous networkAT & T BELL LAB·Filed 1991·Granted Oct 5, 1993·42 cites·28 claims
- 1772US6550030B1On-line testing of the programmable logic blocks in field programmable gate arraysLATTICE SEMICONDUCTOR CORP·Filed 1999·Granted Apr 15, 2003·32 cites·29 claims
- 1866US6574761B1On-line testing of the programmable interconnect network in field programmable gate arraysLATTICE SEMICONDUCTOR CORP·Filed 1999·Granted Jun 3, 2003·24 cites·26 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →