Inventor · disambiguated record
Tadanobu Toba
Also filed as: TOBA TADANOBU
37 granted patents·14 pending applications·71 citations·filing 2003–2025
95Inventor score
Files withHITACHI LTD27HITACHI AUTOMOTIVE SYSTEMS LTD5HITACHI HIGH TECH CORP5HITACHI ASTEMO LTD3TOBA TADANOBU3
Top patents by PatentIndex Score
51 records- 0183US11750424B2Electronic control unit and determination methodHITACHI ASTEMO LTD·Filed 2020·Granted Sep 5, 2023·2 cites·9 claims
- 0283US11247702B2Vehicle control device and electronic control systemHITACHI AUTOMOTIVE SYSTEMS LTD·Filed 2018·Granted Feb 15, 2022·4 cites·12 claims
- 0383US7137055B2Semiconductor testing equipment, testing method for semiconductor, fabrication method of semiconductor, and semiconductor memoryELPIDA MEMORY INC·Filed 2004·Granted Nov 14, 2006·38 cites·15 claims
- 0478US11341398B2Recognition apparatus and learning system using neural networksHITACHI LTD·Filed 2017·Granted May 24, 2022·4 cites·7 claims
- 0578US9933475B2Semiconductor device and multi-chip moduleHITACHI LTD·Filed 2015·Granted Apr 3, 2018·3 cites·19 claims
- 0669US10095570B2Programmable device, error storage system, and electronic system deviceHITACHI LTD·Filed 2014·Granted Oct 9, 2018·2 cites·11 claims
- 0769US7114110B2Semiconductor device, and the method of testing or making of the semiconductor deviceRENESAS TECH CORP·Filed 2003·Granted Sep 26, 2006·12 cites·5 claims
- 0867US10929273B2Application logic, and verification method and configuration method thereofHITACHI LTD·Filed 2017·Granted Feb 23, 2021·1 cites·6 claims
- 0967US9645871B2Soft-error-rate calculating deviceHITACHI LTD·Filed 2013·Granted May 9, 2017·2 cites·15 claims
- 1065US2025315698A1Trouble Document Processing Device and Trouble Document Processing MethodHITACHI LTD·Filed 2025·Application pending·0 cites
- 1161US12511185B2Processor system and failure diagnosis methodHITACHI LTD·Filed 2023·Granted Dec 30, 2025·0 cites·9 claims
- 1260US12332818B2Distributed system and data transfer methodHITACHI LTD·Filed 2022·Granted Jun 17, 2025·0 cites·11 claims
- 1360US11987246B2Electronic control unitHITACHI ASTEMO LTD·Filed 2020·Granted May 21, 2024·0 cites·15 claims
- 1460US7952072B2Test apparatusHITACHI HIGH TECH CORP·Filed 2008·Granted May 31, 2011·0 cites·15 claims
- 1559US12430284B2Arithmetic operation device, testing methodHITACHI ASTEMO LTD·Filed 2021·Granted Sep 30, 2025·0 cites·8 claims
- 1659US2021390795A1Distributed SystemHITACHI LTD·Filed 2021·Application pending·0 cites
- 1758US9489324B2Data processing device, semiconductor external view inspection device, and data volume increase alleviation methodHITACHI HIGH TECH CORP·Filed 2012·Granted Nov 8, 2016·1 cites·12 claims
- 1858US2025348393A1Soft Error Rate Evaluation SystemHITACHI LTD·Filed 2025·Application pending·0 cites
- 1957US12142092B2Distributed system and data processing methodHITACHI LTD·Filed 2022·Granted Nov 12, 2024·0 cites·6 claims
- 2057US8385627B2Method and apparatus for inspecting defects of semiconductor deviceHITACHI HIGH TECH CORP·Filed 2006·Granted Feb 26, 2013·2 cites·7 claims
- 2155US11323344B2Data processing method, edge device, and data processing systemHITACHI LTD·Filed 2021·Granted May 3, 2022·0 cites·15 claims
- 2253US10747920B2Semiconductor LSI design device and design methodHITACHI LTD·Filed 2019·Granted Aug 18, 2020·0 cites·12 claims
- 2352US12339641B2Distributed system and data transmission methodHITACHI LTD·Filed 2021·Granted Jun 24, 2025·0 cites·6 claims
- 2451US11822425B2Programmable device, and controller using the sameHITACHI LTD·Filed 2020·Granted Nov 21, 2023·0 cites·9 claims
- 2551US11360838B2Electronic control device and preferential error detection method of configuration memoryHITACHI AUTOMOTIVE SYSTEMS LTD·Filed 2018·Granted Jun 14, 2022·0 cites·6 claims
- 2651US11327863B2Electronic control device for processing circuit diagnosticsHITACHI AUTOMOTIVE SYSTEMS LTD·Filed 2019·Granted May 10, 2022·0 cites·5 claims
- 2750US11392093B2Prediction control device and methodHITACHI AUTOMOTIVE SYSTEMS LTD·Filed 2018·Granted Jul 19, 2022·0 cites·17 claims
- 2849US8304726B2Test apparatusHIRANO KATSUNORI·Filed 2011·Granted Nov 6, 2012·0 cites·3 claims
- 2948US2022405581A1Neural network optimization system, neural network optimization method, and electronic deviceHITACHI LTD·Filed 2020·Application pending·0 cites
- 3047US9735784B2Programmable logic device and logic integration toolHITACHI LTD·Filed 2013·Granted Aug 15, 2017·0 cites·7 claims
- 3147US8032332B2Semiconductor inspecting apparatusHITACHI HIGH TECH CORP·Filed 2008·Granted Oct 4, 2011·0 cites·12 claims
- 3247US7870428B2Method of diagnosing circuit board, circuit board, and CPU unitHITACHI LTD·Filed 2007·Granted Jan 11, 2011·0 cites·19 claims
- 3347US2023016735A1Computer, Diagnosis System, and Generation MethodHITACHI LTD·Filed 2022·Application pending·0 cites
- 3447US2022261986A1Diagnosis pattern generation method and computerHITACHI LTD·Filed 2021·Application pending·0 cites
- 3547US2022300362A1Distributed system and diagnostic methodHITACHI LTD·Filed 2021·Application pending·0 cites
- 3646US12086240B2Electronic device and attack detection method of electronic deviceHITACHI LTD·Filed 2020·Granted Sep 10, 2024·0 cites·10 claims
- 3746US11367218B2Calculation system and calculation methodHITACHI LTD·Filed 2020·Granted Jun 21, 2022·0 cites·7 claims
- 3846US10438383B2Display deviceHITACHI LTD·Filed 2016·Granted Oct 8, 2019·0 cites·12 claims
- 3945US10339242B2Semiconductor LSI design device and design methodHITACHI LTD·Filed 2017·Granted Jul 2, 2019·0 cites·9 claims
- 4044US11342917B2Electronic control device and circuit reconfiguration methodHITACHI AUTOMOTIVE SYSTEMS LTD·Filed 2018·Granted May 24, 2022·0 cites·10 claims
- 4143US2021357285A1Program Generation Apparatus and Parallel Arithmetic DeviceHITACHI LTD·Filed 2021·Application pending·0 cites
- 4241US2022415609A1Scanning Electron MicroscopeHITACHI HIGH TECH CORP·Filed 2019·Application pending·0 cites
- 4341US2011279143A1Semiconductor wafer testing apparatusTOBA TADANOBU·Filed 2009·Application pending·0 cites
- 4440US2008244329A1Apparatus diagnosing method, apparatus diagnosis module, and apparatus mounted with apparatus diagnosis moduleSHINBO KENICHI·Filed 2008·Application pending·0 cites
- 4538US10401424B2Soft error rate calculation device and calculation method for semiconductor large scale integration (LSI)HITACHI LTD·Filed 2016·Granted Sep 3, 2019·0 cites·6 claims
- 4636US9507895B2Simulation apparatus and simulation method for determining soft error rates for a configured modelTOBA TADANOBU·Filed 2011·Granted Nov 29, 2016·0 cites·9 claims
- 4736US8904233B2Electronic apparatusIBE HIDEFUMI·Filed 2011·Granted Dec 2, 2014·0 cites·9 claims
- 4833US8892967B2Measurement device and measurement methodIBE HIDEFUMI·Filed 2010·Granted Nov 18, 2014·0 cites·13 claims
- 4929US2006164115A1Defect analyzing device for semiconductor integrated circuits, system therefor, and detection methodKOMIYA YASUMARO·Filed 2003·Application pending·0 cites
- 5029US2014164839A1Programmable device, method for reconfiguring programmable device, and electronic deviceTOBA TADANOBU·Filed 2012·Application pending·0 cites
Showing the top 50 of 51 patent records by PatentIndex Score.
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