Inventor · disambiguated record
Yun Jun Huh
Also filed as: HUH YUN J · HUH YUN-JUN
13 granted patents·267 citations·filing 1996–2004
93Inventor score
Top patents by PatentIndex Score
13 records- 0176US6037205AMethod of forming capacitor for semiconductor device using N2 O gasLG SEMICON CO LTD·Filed 1997·Granted Mar 14, 2000·57 cites·16 claims
- 0274US6532976B1Semiconductor wafer cleaning apparatusLG SEMICON CO LTD·Filed 1997·Granted Mar 18, 2003·39 cites·5 claims
- 0371US5788871AEtch-ending point measuring method for wet-etch processLG SEMICON CO LTD·Filed 1996·Granted Aug 4, 1998·40 cites·21 claims
- 0468US5850841ACleaning apparatus of semiconductor deviceLG SEMICON CO LTD·Filed 1997·Granted Dec 22, 1998·34 cites·2 claims
- 0557US5948173ASystem and method for cleaning a semiconductor waferLG SEMICON CO LTD·Filed 1996·Granted Sep 7, 1999·21 cites·18 claims
- 0657US5885360ASemiconductor wafer cleaning apparatusLG SEMICON CO LTD·Filed 1997·Granted Mar 23, 1999·18 cites·4 claims
- 0756US6637443B2Semiconductor wafer cleaning apparatus and methodLG SEMICON CO LTD·Filed 2002·Granted Oct 28, 2003·4 cites·8 claims
- 0852US7022567B2Method of fabricating self-aligned contact structuresGRACE SEMICONDUCTOR MFG CORP·Filed 2004·Granted Apr 4, 2006·5 cites·10 claims
- 0951US5842491ASemiconductor wafer cleaning apparatusLG SEMICON CO LTD·Filed 1996·Granted Dec 1, 1998·15 cites·23 claims
- 1050US5622636AEtch-ending point measuring method for wet-etch processLG SEMICON CO LTD·Filed 1996·Granted Apr 22, 1997·15 cites·24 claims
- 1147US6150220AInsulation layer structure and method for making the sameHYUNDAI ELECTRONICS IND·Filed 1998·Granted Nov 21, 2000·14 cites·26 claims
- 1236US7186603B2Method of forming notched gate structureGRACE SEMICONDUCTOR MFG CORP·Filed 2004·Granted Mar 6, 2007·0 cites·14 claims
- 1335US5783099AEtch-ending point measuring method for vapor etch processLG SEMICON CO LTD·Filed 1996·Granted Jul 21, 1998·5 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →