Inventor · disambiguated record
Ruifeng Guo
Also filed as: GUO RUIFENG
25 granted patents·1 pending application·143 citations·filing 2007–2024
95Inventor score
Top patents by PatentIndex Score
26 records- 0193US10528692B1Cell-aware defect characterization for multibit cellsSYNOPSYS INC·Filed 2018·Granted Jan 7, 2020·17 cites·20 claims
- 0293US9689918B1Test access architecture for stacked memory and logic diesMENTOR GRAPHICS CORP·Filed 2013·Granted Jun 27, 2017·15 cites·18 claims
- 0391US9222978B2Two-dimensional scan architectureHUANG YU·Filed 2012·Granted Dec 29, 2015·11 cites·13 claims
- 0490US8689070B2Method and system for scan chain diagnosisHUANG YU·Filed 2010·Granted Apr 1, 2014·12 cites·26 claims
- 0590US8316265B2Test pattern generation for diagnosing scan chain failuresGUO RUIFENG·Filed 2009·Granted Nov 20, 2012·17 cites·35 claims
- 0689US8261142B2Generating test sets for diagnosing scan chain failuresGUO RUIFENG·Filed 2008·Granted Sep 4, 2012·14 cites·23 claims
- 0787US7788561B2Diagnosing mixed scan chain and system logic defectsHUANG YU·Filed 2007·Granted Aug 31, 2010·15 cites·60 claims
- 0886US9057762B1Faulty chains identification without masking chain patternsMENTOR GRAPHICS CORP·Filed 2013·Granted Jun 16, 2015·6 cites·18 claims
- 0980US9086459B2Detection and diagnosis of scan cell internal defectsGUO RUIFENG·Filed 2009·Granted Jul 21, 2015·10 cites·14 claims
- 1080US8661304B2Test pattern generation for diagnosing scan chain failuresMENTOR GRAPHICS CORP·Filed 2012·Granted Feb 25, 2014·3 cites·13 claims
- 1179US9110138B2Fault dictionary based scan chain failure diagnosisMENTOR GRAPHICS CORP·Filed 2013·Granted Aug 18, 2015·3 cites·18 claims
- 1279US8935582B2Generating test sets for diagnosing scan chain failuresGUO RUIFENG·Filed 2012·Granted Jan 13, 2015·3 cites·14 claims
- 1379US8615695B2Fault dictionary-based scan chain failure diagnosisGUO RUIFENG·Filed 2007·Granted Dec 24, 2013·8 cites·36 claims
- 1479US8527232B2Diagnostic test pattern generation for small delay defectGUO RUIFENG·Filed 2010·Granted Sep 3, 2013·4 cites·12 claims
- 1576US9015543B2Diagnosis-aware scan chain stitchingMENTOR GRAPHICS CORP·Filed 2012·Granted Apr 21, 2015·3 cites·20 claims
- 1671US9977080B2Generating test sets for diagnosing scan chain failuresMENTOR GRAPHICS CORP·Filed 2015·Granted May 22, 2018·1 cites·24 claims
- 1763US9335376B2Test architecture for characterizing interconnects in stacked designsMENTOR GRAPHICS CORP·Filed 2014·Granted May 10, 2016·1 cites·10 claims
- 1857US11951460B1Preparation method and application of tailings-based zeolite@CDs-TiO2 composite photocatalystUNIV TAIYUAN TECHNOLOGY·Filed 2023·Granted Apr 9, 2024·0 cites·6 claims
- 1953US11573873B1Adaptive cell-aware test model for circuit diagnosisSYNOPSYS INC·Filed 2021·Granted Feb 7, 2023·0 cites·20 claims
- 2053US11379649B2Advanced cell-aware fault model for yield analysis and physical failure analysisSYNOPSYS INC·Filed 2021·Granted Jul 5, 2022·0 cites·20 claims
- 2153US11334698B2Cell-aware defect characterization by considering inter-cell timingSYNOPSYS INC·Filed 2021·Granted May 17, 2022·0 cites·20 claims
- 2248US12416224B2Active energy-absorbing shock absorber for perforation combined well testingUNIV SOUTHWEST PETROLEUM·Filed 2024·Granted Sep 16, 2025·0 cites·9 claims
- 2345US8862956B2Compound hold-time fault diagnosisHUANG YU·Filed 2012·Granted Oct 14, 2014·0 cites·18 claims
- 2444US8468409B2Speed-path debug using at-speed scan test patternsGUO RUIFENG·Filed 2009·Granted Jun 18, 2013·0 cites·33 claims
- 2542US10515167B2Cell-aware defect characterization and waveform analysis using multiple strobe pointsSYNOPSYS INC·Filed 2016·Granted Dec 24, 2019·0 cites·57 claims
- 2641US2011035638A1Timing Failure DebugGUO RUIFENG·Filed 2009·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Ruifeng Guo files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →