Inventor · disambiguated record
Masao Iwase
Also filed as: IWASE MASAO
24 granted patents·3 pending applications·224 citations·filing 1989–2025
96Inventor score
Top patents by PatentIndex Score
27 records- 0197US9502299B2Semiconductor memoryTOSHIBA KK·Filed 2014·Granted Nov 22, 2016·19 cites·20 claims
- 0295US11552095B2Semiconductor memory having first and second memory cell regions separated by a third region along a bit line directionKIOXIA CORP·Filed 2021·Granted Jan 10, 2023·2 cites·12 claims
- 0395US9768188B2Semiconductor memoryTOSHIBA MEMORY CORP·Filed 2016·Granted Sep 19, 2017·7 cites·17 claims
- 0494US2025365965A1Semiconductor memoryKIOXIA CORP·Filed 2025·Application pending·0 cites
- 0590US10622372B2Semiconductor memoryTOSHIBA MEMORY CORP·Filed 2019·Granted Apr 14, 2020·3 cites·16 claims
- 0689US12426268B2Semiconductor memory having memory cell regions and other regions alternately along a bit line directionKIOXIA CORP·Filed 2024·Granted Sep 23, 2025·0 cites·20 claims
- 0789US8786003B2Nonvolatile semiconductor memory device and method for manufacturing sameIWASE MASAO·Filed 2012·Granted Jul 22, 2014·12 cites·17 claims
- 0889US5097311ASemiconductor deviceTOSHIBA KK·Filed 1989·Granted Mar 17, 1992·69 cites·3 claims
- 0988US8247860B2Nonvolatile semiconductor memory device and method for manufacturing sameIWASE MASAO·Filed 2009·Granted Aug 21, 2012·17 cites·12 claims
- 1085US7057259B2Semiconductor wafer with ID mark, equipment for and method of manufacturing semiconductor device from themTOSHIBA KK·Filed 2002·Granted Jun 6, 2006·35 cites·38 claims
- 1183US11974439B2Semiconductor memory having memory cell regions and other regions alternately arranged along a bit line directionKIOXIA CORP·Filed 2022·Granted Apr 30, 2024·0 cites·20 claims
- 1280US10199387B2Semiconductor memoryTOSHIBA MEMORY CORP·Filed 2018·Granted Feb 5, 2019·1 cites·16 claims
- 1379US7847337B2Integral circuit including non-volatile memory cellTOSHIBA KK·Filed 2008·Granted Dec 7, 2010·5 cites·13 claims
- 1477US7700381B2Semiconductor wafer with ID mark, equipment for and method of manufacturing semiconductor device from themKABUSHIKIA KAISHA TOSHIBA·Filed 2006·Granted Apr 20, 2010·9 cites·1 claims
- 1576US8241984B2Semiconductor device and method for manufacturing the sameIWASE MASAO·Filed 2010·Granted Aug 14, 2012·4 cites·7 claims
- 1676US7253500B2Semiconductor wafer and a method for manufacturing a semiconductor waferTOSHIBA KK·Filed 2005·Granted Aug 7, 2007·5 cites·5 claims
- 1774US10971511B2Semiconductor memoryTOSHIBA MEMORY CORP·Filed 2020·Granted Apr 6, 2021·0 cites·12 claims
- 1871US7632358B2Cleaning method and a cleaning device for cleaning an edge portion and back face of a waferTOSHIBA KK·Filed 2006·Granted Dec 15, 2009·3 cites·10 claims
- 1967US7613537B2Method and system of recognizing ID marks appended on base materials, and method of manufacturing products by base materials with the ID marksTOSHIBA KK·Filed 2005·Granted Nov 3, 2009·4 cites·20 claims
- 2065US10056403B2Semiconductor memoryTOSHIBA MEMORY CORP·Filed 2017·Granted Aug 21, 2018·0 cites·20 claims
- 2165US7015566B2Semiconductor wafer and a method for manufacturing a semiconductor waferTOSHIBA KK·Filed 2003·Granted Mar 21, 2006·9 cites·13 claims
- 2261US7268053B2Semiconductor wafer and a method for manufacturing a semiconductor waferTOSHIBA KK·Filed 2005·Granted Sep 11, 2007·1 cites·9 claims
- 2355US8735246B2Method for manufacturing nonvolatile semiconductor memory deviceKUBOI SHUICHI·Filed 2012·Granted May 27, 2014·1 cites·16 claims
- 2455US2010051073A1Cleaning method and a cleaning device for cleaning an edge portion and back face of a waferTOSHIBA KK·Filed 2009·Application pending·0 cites
- 2549US5770512ASemiconductor deviceTOSHIBA KK·Filed 1997·Granted Jun 23, 1998·11 cites·19 claims
- 2641US5656859ASemiconductor deviceTOSHIBA KK·Filed 1996·Granted Aug 12, 1997·7 cites·13 claims
- 2732US2016079266A1Semiconductor memory device and method for manufacturing the sameTOSHIBA KK·Filed 2015·Application pending·0 cites
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