Inventor · disambiguated record
Kevin Badgett
Also filed as: BADGETT KEVIN · BADGETT KEVIN B
4 granted patents·17 citations·filing 2009–2013
71Inventor score
Technology areasG11C
Top patents by PatentIndex Score
4 records- 0185US8639994B2Integrated circuit with memory built-in self test (MBIST) circuitry having enhanced features and methodsADVANCED MICRO DEVICES INC·Filed 2013·Granted Jan 28, 2014·9 cites·19 claims
- 0263US8423846B2Integrated circuit with memory built-in self test (MBIST) circuitry having enhanced features and methodsCHEN WEI-YU·Filed 2010·Granted Apr 16, 2013·3 cites·24 claims
- 0356US8392777B2Centralized MBIST failure informationCHEN WEI-YU·Filed 2009·Granted Mar 5, 2013·3 cites·19 claims
- 0455US8468408B2Memory built-in self test (MBIST) circuitry configured to facilitate production of pre-stressed integrated circuits and methodsCHEN WEI-YU·Filed 2010·Granted Jun 18, 2013·2 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →