Inventor · disambiguated record
Satoshi Ohkubo
Also filed as: OHKUBO SATOSHI
14 granted patents·1 pending application·108 citations·filing 1993–2022
90Inventor score
Top patents by PatentIndex Score
15 records- 0174US10523696B2Log analyzing system and methodHITACHI LTD·Filed 2017·Granted Dec 31, 2019·2 cites·6 claims
- 0274US7367487B2Method for friction stir welding, jig therefor, member with friction stir-welded portion, and tool for friction stir weldingHONDA MOTOR CO LTD·Filed 2004·Granted May 6, 2008·18 cites·2 claims
- 0368US10341294B2Unauthorized communication detection system and unauthorized communication detection methodHITACHI LTD·Filed 2017·Granted Jul 2, 2019·2 cites·11 claims
- 0466US8610026B2Laser welding methodKOBAYASHI HARUHIKO·Filed 2009·Granted Dec 17, 2013·3 cites·2 claims
- 0566US5834362AMethod of making a device having a heteroepitaxial substrateFUJITSU LTD·Filed 1996·Granted Nov 10, 1998·32 cites·28 claims
- 0663US11270257B2Commodity monitoring device, commodity monitoring system, output destination device, commodity monitoring method, display method and programNEC CORP·Filed 2017·Granted Mar 8, 2022·1 cites·20 claims
- 0763US6984267B2Manufacture system for semiconductor device with thin gate insulating filmFUJITSU LTD·Filed 2002·Granted Jan 10, 2006·8 cites·6 claims
- 0859US6468926B1Manufacture method and system for semiconductor device with thin gate insulating film of oxynitrideFUJITSU LTD·Filed 1999·Granted Oct 22, 2002·22 cites·23 claims
- 0957US2022156686A1Commodity monitoring device, commodity monitoring system, output destination device, commodity monitoring method, display method and programNEC CORP·Filed 2022·Application pending·0 cites
- 1048US9965625B2Control system and authentication deviceHITACHI LTD·Filed 2014·Granted May 8, 2018·0 cites·16 claims
- 1147US8355806B2Information control system and information control methodHITACHI LTD·Filed 2009·Granted Jan 15, 2013·0 cites·6 claims
- 1241US6188090B1Semiconductor device having a heteroepitaxial substrateFUJITSU LTD·Filed 1998·Granted Feb 13, 2001·9 cites·12 claims
- 1338US5492860AMethod for growing compound semiconductor layersFUJITSU LTD·Filed 1993·Granted Feb 20, 1996·11 cites·20 claims
- 1434US10051004B2Evaluation systemHITACHI LTD·Filed 2016·Granted Aug 14, 2018·0 cites·13 claims
- 1531US10348746B2Incident detection system including gateway device and serverHITACHI LTD·Filed 2015·Granted Jul 9, 2019·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →