Inventor · disambiguated record
Miki Isawa
Also filed as: ISAWA MIKI
11 granted patents·1 pending application·17 citations·filing 2010–2018
83Inventor score
Top patents by PatentIndex Score
12 records- 0186US8648300B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2013·Granted Feb 11, 2014·7 cites·12 claims
- 0278US9472376B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2013·Granted Oct 18, 2016·4 cites·10 claims
- 0374US9000365B2Pattern measuring apparatus and computer programMOCHIZUKI YUZURU·Filed 2010·Granted Apr 7, 2015·5 cites·7 claims
- 0463US10545018B2Pattern measurement device, and computer program for measuring patternHITACHI HIGH TECH CORP·Filed 2014·Granted Jan 28, 2020·1 cites·11 claims
- 0558US10732512B2Image processor, method for generating pattern using self-organizing lithographic techniques and computer programHITACHI HIGH TECH CORP·Filed 2018·Granted Aug 4, 2020·0 cites·2 claims
- 0651US9589343B2Pattern measurement device, evaluation method of polymer compounds used in self-assembly lithography, and computer programHITACHI HIGH TECH CORP·Filed 2013·Granted Mar 7, 2017·0 cites·17 claims
- 0751US9502212B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2014·Granted Nov 22, 2016·0 cites·10 claims
- 0851US2015277237A1Image processor, method for generating pattern using self- organizing lithographic techniques and computer programHITACHI HIGH TECH CORP·Filed 2013·Application pending·0 cites
- 0949US10854420B2Pattern evaluation deviceHITACHI HIGH TECH CORP·Filed 2016·Granted Dec 1, 2020·0 cites·6 claims
- 1049US9831062B2Method for pattern measurement, method for setting device parameters of charged particle radiation device, and charged particle radiation deviceHITACHI HIGH TECH CORP·Filed 2014·Granted Nov 28, 2017·0 cites·10 claims
- 1145US9804107B2Pattern measurement device and computer program for evaluating patterns based on centroids of the patternsHITACHI HIGH TECH CORP·Filed 2014·Granted Oct 31, 2017·0 cites·11 claims
- 1245US9627171B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2013·Granted Apr 18, 2017·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →