Inventor · disambiguated record
Leonid Gurov
Also filed as: GUROV LEONID
5 granted patents·7 citations·filing 2008–2023
69Inventor score
Top patents by PatentIndex Score
5 records- 0169US8112249B2System and methods for parametric test time reductionGUROV LEONID·Filed 2008·Granted Feb 7, 2012·4 cites·22 claims
- 0268US11852684B2Methods and systems for detecting defects on an electronic assemblyOPTIMAL PLUS LTD·Filed 2023·Granted Dec 26, 2023·0 cites·20 claims
- 0361US8838408B2Misalignment indication decision system and methodLINDE REED·Filed 2010·Granted Sep 16, 2014·2 cites·40 claims
- 0459US8781773B2System and methods for parametric testingGUROV LEONID·Filed 2011·Granted Jul 15, 2014·1 cites·59 claims
- 0553US11650250B2Methods and systems for detecting defects on an electronic assemblyOPTIMAL PLUS LTD·Filed 2019·Granted May 16, 2023·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →