Inventor · disambiguated record
Alexander Kadyshevitch
Also filed as: KADYSHEVITCH ALEXANDER
19 granted patents·221 citations·filing 1997–2021
93Inventor score
Files withAPPLIED MATERIALS ISRAEL LTD9EL MUL TECH LTD4APPLIED MATERIALS INC2NOVA MEASURING INSTR INC2PHOTON DYNAMICS INC1
Top patents by PatentIndex Score
19 records- 0189US11183377B2Mass spectrometer detector and system and method using the sameNOVA MEASURING INSTR INC·Filed 2017·Granted Nov 23, 2021·6 cites·19 claims
- 0281US7842933B2System and method for measuring overlay errorsAPPLIED MATERIALS ISRAEL LTD·Filed 2003·Granted Nov 30, 2010·46 cites·8 claims
- 0381US6407386B1System and method for automatic analysis of defect material on semiconductorsAPPLIED MATERIALS INC·Filed 1999·Granted Jun 18, 2002·59 cites·16 claims
- 0480US6433356B1Hybrid organic-inorganic semiconductor structures and sensors based thereonYEDA RES & DEV·Filed 1997·Granted Aug 13, 2002·60 cites·35 claims
- 0578US7279689B2Contact opening metrologyAPPLIED MATERIALS ISRAEL LTD·Filed 2005·Granted Oct 9, 2007·4 cites·19 claims
- 0676US9523714B2Electrical inspection of electronic devices using electron-beam induced plasma probesPHOTON DYNAMICS INC·Filed 2014·Granted Dec 20, 2016·4 cites·45 claims
- 0775US7038224B2Contact opening metrologyAPPLIED MATERIALS ISRAEL LTD·Filed 2003·Granted May 2, 2006·13 cites·71 claims
- 0872US11823883B2Mass spectrometer detector and system and method using the sameNOVA MEASURING INSTR INC·Filed 2021·Granted Nov 21, 2023·0 cites·7 claims
- 0967US7078690B2Monitoring of contact hole productionAPPLIED MATERIALS ISRAEL LTD·Filed 2002·Granted Jul 18, 2006·12 cites·32 claims
- 1066US7476875B2Contact opening metrologyAPPLIED MATERIALS ISRAEL LTD·Filed 2007·Granted Jan 13, 2009·1 cites·15 claims
- 1163US11536604B1Light sensor assembly in a vacuum environmentEL MUL TECH LTD·Filed 2020·Granted Dec 27, 2022·0 cites·20 claims
- 1261US11587776B1Ion detection systemsEL MUL TECH LTD·Filed 2020·Granted Feb 21, 2023·0 cites·18 claims
- 1358US11493383B2Magnetic photomultiplier tube systemEL MUL TECH LTD·Filed 2020·Granted Nov 8, 2022·0 cites·20 claims
- 1458US7473911B2Specimen current mapperAPPLIED MATERIALS ISRAEL LTD·Filed 2003·Granted Jan 6, 2009·8 cites·27 claims
- 1556US6781126B2Auger-based thin film metrologyAPPLIED MATERIALS INC·Filed 2002·Granted Aug 24, 2004·2 cites·25 claims
- 1652US11656371B1High dynamic range detector with controllable photon flux functionalityEL MUL TECH LTD·Filed 2021·Granted May 23, 2023·0 cites·21 claims
- 1751US7381978B2Contact opening metrologyAPPLIED MATERIALS ISRAEL LTD·Filed 2005·Granted Jun 3, 2008·0 cites·16 claims
- 1847US7602197B2High current electron beam inspectionAPPLIED MATERIALS ISRAEL LTD·Filed 2004·Granted Oct 13, 2009·4 cites·21 claims
- 1935US7170056B2Methodology and apparatus for leakage detectionAPPLIED MATERIALS ISRAEL LTD·Filed 2004·Granted Jan 30, 2007·2 cites·10 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →