Inventor · disambiguated record
Hitoshi Takabayashi
Also filed as: TAKABAYASHI HITOSHI
2 granted patents·194 citations·filing 1984–1990
70Inventor score
Top patents by PatentIndex Score
2 records- 0195US4660980AApparatus for measuring thickness of object transparent to light utilizing interferometric methodANRITSU ELECTRIC CO LTD·Filed 1984·Granted Apr 28, 1987·154 cites·11 claims
- 0267US5043570AHigh resolution microscoping system using convolution integration processANRITSU CORP·Filed 1990·Granted Aug 27, 1991·40 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →