Inventor · disambiguated record
Eric Lindbloom
Also filed as: LINDBLOOM ERIC
4 granted patents·353 citations·filing 1983–1988
82Inventor score
Files withIBM4
Top patents by PatentIndex Score
4 records- 0196US4801870AWeighted random pattern testing apparatus and methodIBM·Filed 1988·Granted Jan 31, 1989·154 cites·4 claims
- 0294US4687988AWeighted random pattern testing apparatus and methodIBM·Filed 1985·Granted Aug 18, 1987·133 cites·3 claims
- 0387US4745355AWeighted random pattern testing apparatus and methodIBM·Filed 1987·Granted May 17, 1988·58 cites·6 claims
- 0449US4546473ARandom pattern self test designIBM·Filed 1983·Granted Oct 8, 1985·8 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →