Inventor · disambiguated record
Keiichi Yoshizumi
Also filed as: YOSHIZUMI KEIICHI
49 granted patents·2 pending applications·770 citations·filing 1982–2010
98Inventor score
Files withMATSUSHITA ELECTRIC INDUSTRIAL CO LTD19HITACHI LTD16RENESAS TECH CORP9PANASONIC CORP3MARSUSHITA ELECTRIC IND CO LTD1
Top patents by PatentIndex Score
51 records- 0186US8006402B2Shape measuring apparatus and shape measuring methodPANASONIC CORP·Filed 2009·Granted Aug 30, 2011·17 cites·18 claims
- 0284US6480286B1Method and apparatus for measuring thickness variation of a thin sheet material, and probe reflector used in the apparatusMATSUSHITA ELECTRIC INUDSTRIAL·Filed 2000·Granted Nov 12, 2002·39 cites·11 claims
- 0384US5444012AMethod for manufacturing semiconductor integrated circuit device having a fuse elementHITACHI LTD·Filed 1994·Granted Aug 22, 1995·84 cites·12 claims
- 0484US4507766AOptical device for optically recording and reproducing information signals on an information carrierMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1982·Granted Mar 26, 1985·26 cites·5 claims
- 0583US7514749B2Semiconductor device and a method of manufacturing the sameRENESAS TECH CORP·Filed 2008·Granted Apr 7, 2009·9 cites·7 claims
- 0683US7391083B2Semiconductor device and a method of manufacturing the sameRENESAS TECH CORP·Filed 2006·Granted Jun 24, 2008·9 cites·10 claims
- 0782US5144150AConfiguration measuring apparatusMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1991·Granted Sep 1, 1992·47 cites·6 claims
- 0878US7393737B2Semiconductor device and a method of manufacturing the sameRENESAS TECH CORP·Filed 2006·Granted Jul 1, 2008·6 cites·7 claims
- 0977US6579754B2Semiconductor memory device having ferroelectric film and manufacturing method thereofHITACHI LTD·Filed 2001·Granted Jun 17, 2003·15 cites·12 claims
- 1075US7065893B2Measurement probe and using method for the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Granted Jun 27, 2006·20 cites·11 claims
- 1175US7029224B2Method and apparatus for transferring a thin plateMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2003·Granted Apr 18, 2006·19 cites·7 claims
- 1275US5455677AOptical probeMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1994·Granted Oct 3, 1995·34 cites·5 claims
- 1373US5917181AProfile measuring apparatusMARSUSHITA ELECTRIC IND CO LTD·Filed 1997·Granted Jun 29, 1999·44 cites·22 claims
- 1472US7797851B2Shape measurement device probe and shape measurement devicePANASONIC CORP·Filed 2007·Granted Sep 21, 2010·8 cites·13 claims
- 1572US5508540ASemiconductor integrated circuit device and process of manufacturing the sameHITACHI LTD·Filed 1994·Granted Apr 16, 1996·30 cites·24 claims
- 1671US6239457B1Semiconductor memory device and manufacturing method thereofHITACHI LTD·Filed 1999·Granted May 29, 2001·28 cites·19 claims
- 1771US4822139AOptical head apparatus for optical disc playerMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1985·Granted Apr 18, 1989·17 cites·3 claims
- 1867US5616916AConfiguration measuring method and apparatus for optically detecting a displacement of a probe due to an atomic forceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1995·Granted Apr 1, 1997·35 cites·20 claims
- 1966US6763319B2Profilometer and method for measuring, and method for manufacturing object of surface profilingMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted Jul 13, 2004·13 cites·16 claims
- 2066US5283630AError correcting method for measuring object surface using three-dimension measuring apparatusMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1992·Granted Feb 1, 1994·25 cites·12 claims
- 2165US7759763B2Semiconductor device and a method of manufacturing the sameRENESAS TECH CORP·Filed 2008·Granted Jul 20, 2010·2 cites·9 claims
- 2265US7259054B2Method of manufacturing a semiconductor device that includes a process for forming a high breakdown voltage field effect transistorRENESAS TECH CORP·Filed 2004·Granted Aug 21, 2007·11 cites·6 claims
- 2365US6623986B2Method of manufacturing a ferroelectric memory deviceHITACHI LTD·Filed 2001·Granted Sep 23, 2003·9 cites·2 claims
- 2464US8324706B2Semiconductor device and a method of manufacturing the sameYOSHIZUMI KEIICHI·Filed 2010·Granted Dec 4, 2012·2 cites·25 claims
- 2564US7520067B2Three-dimensional measurement probePANASONIC CORP·Filed 2007·Granted Apr 21, 2009·8 cites·11 claims
- 2660US5880497ASemiconductor integrated circuit device having capacitance element and process of manufacturing the sameHITACHI LTD·Filed 1996·Granted Mar 9, 1999·18 cites·30 claims
- 2759US7592669B2Semiconductor device with MISFET that includes embedded insulating film arranged between source/drain regions and channelRENESAS TECH CORP·Filed 2007·Granted Sep 22, 2009·1 cites·10 claims
- 2857US6026583AShape measuring apparatus and methodMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1997·Granted Feb 22, 2000·21 cites·17 claims
- 2957US5610856ASemiconductor integrated circuit deviceHITACHI LTD·Filed 1996·Granted Mar 11, 1997·18 cites·10 claims
- 3056US5319194AApparatus for measuring birefringence without employing rotating mechanismMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1993·Granted Jun 7, 1994·19 cites·3 claims
- 3155US7012680B2Method and apparatus for quantitative quality inspection of substrate such as waferMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2003·Granted Mar 14, 2006·6 cites·16 claims
- 3255US5315374AThree-dimensional measuring apparatusMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1992·Granted May 24, 1994·17 cites·5 claims
- 3355US4611916AOptical measuring apparatusMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1984·Granted Sep 16, 1986·12 cites·3 claims
- 3453US6509597B2Ferroelectric memory deviceHITACHI LTD·Filed 2001·Granted Jan 21, 2003·5 cites·5 claims
- 3553US4776699AOptical measuring deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1986·Granted Oct 11, 1988·13 cites·7 claims
- 3652US5780328AProcess for producing semiconductor integrated circuitHITACHI LTD·Filed 1997·Granted Jul 14, 1998·16 cites·20 claims
- 3751US6445025B2Semiconductor memory device and manufacturing method thereofHITACHI LTD·Filed 2001·Granted Sep 3, 2002·2 cites·6 claims
- 3850US6326216B1Process for producing semiconductor integrated circuit deviceHITACHI LTD·Filed 1997·Granted Dec 4, 2001·13 cites·55 claims
- 3949US6710883B2Apparatus and method for measuring flatness of thin plateMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted Mar 23, 2004·3 cites·7 claims
- 4048US6770492B2Ferroelectric memory deviceRENESAS TECH CORP·Filed 2002·Granted Aug 3, 2004·3 cites·5 claims
- 4146US5459939AApparatus and method for measuring width of micro gapMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1994·Granted Oct 24, 1995·11 cites·17 claims
- 4246US5328864AMethod of doping gate electrodes discretely with either P-type or N-type impurities to form discrete semiconductor regionsHITACHI LTD·Filed 1991·Granted Jul 12, 1994·9 cites·7 claims
- 4346US4766303AOptical information system having a birefringence plate movably disposed in accordance with the detected light intensityMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1987·Granted Aug 23, 1988·6 cites·16 claims
- 4444US6316798B1Ferroelectric memory device and method for manufacturing the sameHITACHI LTD·Filed 1997·Granted Nov 13, 2001·6 cites·4 claims
- 4542US6995058B2Semiconductor memory device and manufacturing method thereofRENESAS TECH CORP·Filed 2002·Granted Feb 7, 2006·0 cites·12 claims
- 4640US5371023AGate circuit, semiconductor integrated circuit device and method of fabrication thereof, semiconductor memory and microprocessorHITACHI LTD·Filed 1992·Granted Dec 6, 1994·7 cites·13 claims
- 4740US5032537AMethod of doping gate electrodes discretely with either P-type or N-type impurities to form discrete semiconductor regionsHITACHI LTD·Filed 1990·Granted Jul 16, 1991·6 cites·8 claims
- 4840US2002048941A1Process for producing semiconductor integrated circuit deviceFiled 2001·Application pending·0 cites
- 4939US6934036B2Configuration measuring apparatus and methodMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted Aug 23, 2005·1 cites·16 claims
- 5039US6906365B2Ferroelectric memory device including an upper protection electrodeHITACHI LTD·Filed 2001·Granted Jun 14, 2005·0 cites·2 claims
Showing the top 50 of 51 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →