Inventor · disambiguated record
Stephen Swaringen
Also filed as: SWARINGEN STEPHEN · SWARINGEN STEPHEN N · SWARINGEN STEPHEN NEAL
13 granted patents·3 pending applications·457 citations·filing 1999–2011
93Inventor score
Files withELECTRO SCIENT IND INC10BRULAND KELLY2BRULAND KELLY J2ELECTRON SCIENT IND INC1SWARINGEN STEPHEN NEAL1
Top patents by PatentIndex Score
16 records- 0196US7425471B2Semiconductor structure processing using multiple laser beam spots spaced on-axis with cross-axis offsetELECTRO SCIENT IND INC·Filed 2005·Granted Sep 16, 2008·49 cites·35 claims
- 0295US6172325B1Laser processing power output stabilization apparatus and method employing processing position feedbackELECTRO SCIENT IND INC·Filed 1999·Granted Jan 9, 2001·178 cites·10 claims
- 0391US6816294B2On-the-fly beam path error correction for memory link processingELECTRO SCIENT IND INC·Filed 2002·Granted Nov 9, 2004·67 cites·19 claims
- 0490US7363180B2Method for correcting systematic errors in a laser processing systemELECTRO SCIENT IND INC·Filed 2005·Granted Apr 22, 2008·23 cites·15 claims
- 0590US7245412B2On-the-fly laser beam path error correction for specimen target location processingELECTRO SCIENT IND INC·Filed 2004·Granted Jul 17, 2007·56 cites·30 claims
- 0688US7435927B2Semiconductor link processing using multiple laterally spaced laser beam spots with on-axis offsetELECTRON SCIENT IND INC·Filed 2005·Granted Oct 14, 2008·27 cites·35 claims
- 0785US8383982B2Methods and systems for semiconductor structure processing using multiple laser beam spotsELECTRO SCIENT IND INC·Filed 2007·Granted Feb 26, 2013·14 cites·5 claims
- 0883US8497450B2On-the fly laser beam path dithering for enhancing throughputBRULAND KELLY·Filed 2007·Granted Jul 30, 2013·15 cites·45 claims
- 0980US8148211B2Semiconductor structure processing using multiple laser beam spots spaced on-axis delivered simultaneouslyBRULAND KELLY J·Filed 2005·Granted Apr 3, 2012·11 cites·40 claims
- 1077US7923306B2Semiconductor structure processing using multiple laser beam spotsELECTRO SCIENT IND INC·Filed 2005·Granted Apr 12, 2011·6 cites·24 claims
- 1174US8515701B2Method for detecting particulate contamination under a workpieceSWARINGEN STEPHEN NEAL·Filed 2008·Granted Aug 20, 2013·7 cites·5 claims
- 1268US8049135B2Systems and methods for alignment of laser beam(s) for semiconductor link processingELECTRO SCIENT IND INC·Filed 2006·Granted Nov 1, 2011·4 cites·46 claims
- 1346US8238007B2On-the-fly laser beam path error correction for specimen target location processingBRULAND KELLY·Filed 2006·Granted Aug 7, 2012·0 cites·25 claims
- 1446US2011186555A1System for semiconductor structure processing using multiple laser beam spotsBRULAND KELLY J·Filed 2011·Application pending·0 cites
- 1546US2009011614A1Reconfigurable semiconductor structure processing using multiple laser beam spotsELECTRO SCIENT IND INC·Filed 2008·Application pending·0 cites
- 1645US2008124816A1Systems and methods for semiconductor structure processing using multiple laser beam spotsELECTRO SCIENT IND INC·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →