Inventor · disambiguated record
Martin Commons
Also filed as: COMMONS MARTIN
3 granted patents·1 pending application·25 citations·filing 2001–2003
68Inventor score
Top patents by PatentIndex Score
4 records- 0159US6440759B1Method of measuring combined critical dimension and overlay in single stepINFINEON TECHNOLOGIES AG·Filed 2001·Granted Aug 27, 2002·10 cites·9 claims
- 0257US6849495B2Selective silicidation scheme for memory devicesINFINEON TECHNOLOGIES AG·Filed 2003·Granted Feb 1, 2005·9 cites·17 claims
- 0351US6566227B2Strap resistance using selective oxidation to cap DT poly before STI etchINFINEON TECHNOLOGIES AG·Filed 2001·Granted May 20, 2003·6 cites·24 claims
- 0434US2004058550A1Dummy patterns for reducing proximity effects and method of using sameINFINEON TECHNOLOGIES CORP·Filed 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →