Inventor · disambiguated record
Bernard Drevillon
Also filed as: DREVILLON BERNARD
21 granted patents·4 pending applications·442 citations·filing 1995–2014
95Inventor score
Top patents by PatentIndex Score
25 records- 0193US7713779B2Photoactive nanocomposite and method for the production thereofCOMMISSARIAT ENERGIE ATOMIQUE·Filed 2005·Granted May 11, 2010·55 cites·18 claims
- 0287US7298480B2Broadband ellipsometer / polarimeter systemECOLE POLYTECH·Filed 2005·Granted Nov 20, 2007·18 cites·26 claims
- 0382US6657708B1Apparatus for optically characterising thin layered materialJOBIN YVON S A·Filed 1999·Granted Dec 2, 2003·80 cites·13 claims
- 0476US6613434B1Method for treating polymer surfaceCENTRE NAT RECH SCIENT·Filed 2000·Granted Sep 2, 2003·21 cites·16 claims
- 0574US5757671AMulti-detector ellipsometer and process of multi-detector ellipsometric measurementCENTRE NAT RECH SCIENT·Filed 1996·Granted May 26, 1998·50 cites·14 claims
- 0672US7196792B2Liquid crystal based polarimetric system, a process for the calibration of this polarimetric system, and a polarimetric measurement processECOLE POLYTECH·Filed 2003·Granted Mar 27, 2007·11 cites·21 claims
- 0772US6177995B1Polarimeter and corresponding measuring methodCENTRE NAT RECH SCIENT·Filed 1999·Granted Jan 23, 2001·45 cites·10 claims
- 0872US6175412B1Optical component for polarization modulation, a mueller polarimeter and ellipsometer containing such an optical component, a process for the calibration of this ellipsometer, and an ellipsometric measurement processCENTRE NAT RECH SCIENT·Filed 1997·Granted Jan 16, 2001·43 cites·19 claims
- 0969US7859661B2Polarimetric Raman system and method for analysing a sampleECOLE POLYTECH·Filed 2007·Granted Dec 28, 2010·6 cites·13 claims
- 1066US5536936ASpectroscopic ellipsometer modulated by an external excitationRECH CENTRE NAT DE·Filed 1995·Granted Jul 16, 1996·34 cites·17 claims
- 1165US8405830B2Device and method for taking spectroscopic polarimetric measurements in the visible and near-infrared rangesCATTELAN DENIS·Filed 2009·Granted Mar 26, 2013·4 cites·18 claims
- 1263US9366694B2Microscope having a multimode local probe, tip-enhanced raman microscope, and method for controlling the distance between the local probe and the sampleECOLE POLYTECH·Filed 2014·Granted Jun 14, 2016·2 cites·10 claims
- 1361US5485271ADual-modulation interferometric ellipsometerCENTRE NAT RECH SCIENT·Filed 1995·Granted Jan 16, 1996·32 cites·10 claims
- 1455US7046379B2Method for characterizing or controlling the production of a thin-layered component using optical methodsJOBIN YVON S A·Filed 2002·Granted May 16, 2006·1 cites·15 claims
- 1552US8214024B2Electronic polarimetric imaging system for a colposcopy device and an adapter housingDE MARTINO ANTONELLO·Filed 2006·Granted Jul 3, 2012·4 cites·20 claims
- 1652US5666200AMethod of ellipsometric measurement, an ellipsometer and device for controlling the carrying out of layers using such method and apparatusINSTRUMENTS SA·Filed 1996·Granted Sep 9, 1997·24 cites·10 claims
- 1749US2010074807A1Apparatus for generating a plasmaECOLE POLYTECH·Filed 2008·Application pending·0 cites
- 1844US7863113B2Transistor for active matrix display and a method for producing said transistorCENTRE NAT RECH SCIENT·Filed 2004·Granted Jan 4, 2011·4 cites·11 claims
- 1943US2005012041A1FTIR ellipsometry device and process for characterization and further identification of samples of complex biological materials, notably micro-organismsFiled 2004·Application pending·0 cites
- 2041US7777880B2Metrological characterisation of microelectronic circuitsECOLE POLYTECH·Filed 2005·Granted Aug 17, 2010·0 cites·23 claims
- 2138US6914675B1Ellipsometric method and control device for making a thin-layered componentCENTRE NAT RECH SCIENT·Filed 1999·Granted Jul 5, 2005·6 cites·18 claims
- 2238US6868312B2Method for real-time control of the fabrication of a thin-film structure by ellipsometric measurementAIR LIQUIDE·Filed 2001·Granted Mar 15, 2005·0 cites·33 claims
- 2335US2005105088A1Method and device for polarimetric measurement of the mueller matrix coefficients of a sample in the far ultraviolet to visible spectral rangeFiled 2003·Application pending·0 cites
- 2435US2007091030A1Electronic control cell for an active matrix display organic electroluminescent diode and methods for the operation thereof and displayECOLE POLYTECH·Filed 2004·Application pending·0 cites
- 2531US6561198B1Method and installation for treating a metal part surfaceAIR LIQUIDE·Filed 1999·Granted May 13, 2003·2 cites·20 claims
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