Inventor · disambiguated record
Yuezhong Du
Also filed as: DU YUEZHONG
2 granted patents·2 citations·filing 2013–2016
38Inventor score
Technology areasH10P
Files withKLA TENCOR CORP2
Top patents by PatentIndex Score
2 records- 0163US9277186B2Generating a wafer inspection process using bit failures and virtual inspectionKLA TENCOR CORP·Filed 2013·Granted Mar 1, 2016·2 cites·37 claims
- 0240US10014229B2Generating a wafer inspection process using bit failures and virtual inspectionKLA TENCOR CORP·Filed 2016·Granted Jul 3, 2018·0 cites·39 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →