Inventor · disambiguated record
Yukiharu Mikawa
Also filed as: MIKAWA YUKIHARU
1 granted patent·1 pending application·5 citations·filing 1996–2002
26Inventor score
Files withMITSUBISHI ELEC SEMICONDUCTOR1
Top patents by PatentIndex Score
2 records- 0132US2004003006A1Layout pattern verification device for verifying a layout pattern of transistors in the manufacturing of a large scale integrated circuitFiled 2002·Application pending·0 cites
- 0224US5828673ALogical check apparatus and method for semiconductor circuits and storage medium storing logical check program for semiconductor circuitsMITSUBISHI ELEC SEMICONDUCTOR·Filed 1996·Granted Oct 27, 1998·5 cites·18 claims
Join the waitlist — get patent alerts
Get an alert when Yukiharu Mikawa files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →