Inventor · disambiguated record
Jon Lescrenier
Also filed as: LESCRENIER JON · LESCRENIER JON CHARLES
2 granted patents·10 citations·filing 2005–2009
54Inventor score
Technology areasG11C
Top patents by PatentIndex Score
2 records- 0165US7324391B2Method for determining and classifying SRAM bit fail modes suitable for production test implementation and real time feedbackTEXAS INSTRUMENTS INC·Filed 2005·Granted Jan 29, 2008·8 cites·22 claims
- 0247US9208902B2Bitline leakage detection in memoriesPIOUS BEENA·Filed 2009·Granted Dec 8, 2015·2 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →