Inventor · disambiguated record
Jae-Min Jeon
Also filed as: JEON JAE-MIN
2 granted patents·2 pending applications·0 citations·filing 2005–2024
21Inventor score
Top patents by PatentIndex Score
4 records- 0150US2025210387A1Semiconductor device inspection device and semiconductor device inspection methodSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0247US12449353B2NDIR gas measuring device for detecting presence of gas other than measurement target gasSESUNG INC·Filed 2023·Granted Oct 21, 2025·0 cites·3 claims
- 0343US12482681B2Semiconductor inspection method including heating a top surface of a semiconductor packageSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Nov 25, 2025·0 cites·11 claims
- 0420US2006117102A1Apparatus and method for diagnosing networkJEON JAE-MIN·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →