Inventor · disambiguated record
Yuen Tat Lee
Also filed as: LEE YUEN TAT
3 granted patents·7 citations·filing 2006–2015
57Inventor score
Top patents by PatentIndex Score
3 records- 0172US10198333B2Test, validation, and debug architectureTROBOUGH MARK B·Filed 2010·Granted Feb 5, 2019·6 cites·20 claims
- 0244US9971644B2Serial I/O functional testerINTEL CORP·Filed 2015·Granted May 15, 2018·0 cites·21 claims
- 0339US7403027B2Apparatuses and methods for outputting signals during self-heat burn-in modes of operationINTEL CORP·Filed 2006·Granted Jul 22, 2008·1 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →