Inventor · disambiguated record
Benjamin P. Lynch
Also filed as: LYNCH BENJAMIN P
3 granted patents·16 citations·filing 2003–2008
67Inventor score
Files withIBM3
Top patents by PatentIndex Score
3 records- 0166US7305600B2Partial good integrated circuit and method of testing sameIBM·Filed 2003·Granted Dec 4, 2007·11 cites·19 claims
- 0256US7478301B2Partial good integrated circuit and method of testing sameIBM·Filed 2008·Granted Jan 13, 2009·2 cites·9 claims
- 0354US7434129B2Partial good integrated circuit and method of testing sameIBM·Filed 2007·Granted Oct 7, 2008·3 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →