Inventor · disambiguated record
Lars Bomholt
Also filed as: BOMHOLT LARS · BOMHOLT LARS HENNING
10 granted patents·1 pending application·78 citations·filing 2005–2017
89Inventor score
Top patents by PatentIndex Score
11 records- 0193US8609550B2Methods for manufacturing integrated circuit devices having features with reduced edge curvatureMOROZ VICTOR·Filed 2012·Granted Dec 17, 2013·11 cites·22 claims
- 0290US9379183B2Methods for manufacturing integrated circuit devices having features with reduced edge curvatureSYNOPSYS INC·Filed 2015·Granted Jun 28, 2016·5 cites·6 claims
- 0390US7792595B1Method and system for enhancing the yield in semiconductor manufacturingSYNOPSYS INC·Filed 2005·Granted Sep 7, 2010·30 cites·9 claims
- 0489US9152750B2Methods for manufacturing integrated circuit devices having features with reduced edge curvatureSYNOPSYS INC·Filed 2014·Granted Oct 6, 2015·6 cites·12 claims
- 0586US9064808B2Integrated circuit devices having features with reduced edge curvature and methods for manufacturing the sameMOROZ VICTOR·Filed 2011·Granted Jun 23, 2015·6 cites·26 claims
- 0682US10256293B2Integrated circuit devices having features with reduced edge curvature and methods for manufacturing the sameSYNOPSYS INC·Filed 2017·Granted Apr 9, 2019·2 cites·21 claims
- 0782US10032859B2Methods for manufacturing integrated circuit devices having features with reduced edge curvatureSYNOPSYS INC·Filed 2016·Granted Jul 24, 2018·2 cites·46 claims
- 0882US10018996B2Method and system for enhancing the yield in semiconductor manufacturingBOMHOLT LARS·Filed 2010·Granted Jul 10, 2018·7 cites·16 claims
- 0977US8090464B2Method and system for enhancing the yield in semiconductor manufacturingBOMHOLT LARS·Filed 2008·Granted Jan 3, 2012·9 cites·14 claims
- 1054US9786734B2Integrated circuit devices having features with reduced edge curvature and methods for manufacturing the sameSYNOPSYS INC·Filed 2015·Granted Oct 10, 2017·0 cites·10 claims
- 1136US2015356232A1Method and System for Generating a Circuit Design, Method for Calibration of an Inspection Apparatus and Method for Process Control and Yield ManagementSYNOPSYS INC·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →