Inventor · disambiguated record
Ondrej Shanel
Also filed as: SHANEL ONDREJ · SHANEL ONDREJ L · SHANEL ONDREJ LUDMIL · SHÀNËL ONDREJ LUDMIL
6 granted patents·2 pending applications·7 citations·filing 2014–2023
72Inventor score
Files withFEI CO8
Top patents by PatentIndex Score
8 records- 0178US11101104B2Multi modal cryo compatible GUID gridFEI CO·Filed 2019·Granted Aug 24, 2021·3 cites·20 claims
- 0277US11430633B2Illumination apertures for extended sample lifetimes in helical tomographyFEI CO·Filed 2020·Granted Aug 30, 2022·1 cites·19 claims
- 0361US2025166963A1Method and System for Imaging a SampleFEI CO·Filed 2023·Application pending·0 cites
- 0458US10520454B2Innovative X-ray source for use in tomographic imagingFEI CO·Filed 2017·Granted Dec 31, 2019·2 cites·16 claims
- 0556US12431322B2System and method for handling samples for study in a charged particle apparatus, such as a transmission electron microscopeFEI CO·Filed 2023·Granted Sep 30, 2025·0 cites·20 claims
- 0656US9595359B2Magnetic lens for focusing a beam of charged particlesFEI CO·Filed 2014·Granted Mar 14, 2017·1 cites·20 claims
- 0753US2025372341A1Method of virtual sectioning of stem sample using combination of seFEI CO·Filed 2023·Application pending·0 cites
- 0852US11587762B2Device and method for determining a property of a sample that is to be used in a charged particle microscopeFEI CO·Filed 2021·Granted Feb 21, 2023·0 cites·20 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →