Inventor · disambiguated record

Kai-Yuan Chi

Also filed as: CHI KAI-YUAN

1 granted patent·1 pending application·3 citations·filing 2014–2024

21Inventor score

Technology areasG06T H01J

Files withASML NETHERLANDS BV1 SAMSUNG ELECTRONICS CO LTD1

Top patents by PatentIndex Score

2 records

0168US9542740B2Method for detecting defect in patternSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Jan 10, 2017·3 cites·11 claims
0256US2024355578A1Software, methods, and systems for determination of a local focus pointASML NETHERLANDS BV·Filed 2024·Application pending·0 cites

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →