Inventor · disambiguated record
Rakesh Reddy Kandula
Also filed as: KANDULA RAKESH · KANDULA RAKESH REDDY
6 granted patents·19 pending applications·9 citations·filing 2017–2024
73Inventor score
Top patents by PatentIndex Score
25 records- 0194US11444955B2Verification of in-situ network telemetry data in a packet-switched networkCISCO TECH INC·Filed 2020·Granted Sep 13, 2022·6 cites·20 claims
- 0273US11979412B2Verification of in-situ network telemetry data in a packet-switched networkCISCO TECH INC·Filed 2023·Granted May 7, 2024·0 cites·20 claims
- 0370US11683324B2Verification of in-situ network telemetry data in a packet-switched networkCISCO TECH INC·Filed 2022·Granted Jun 20, 2023·0 cites·20 claims
- 0469US10237079B2Intelligent network sleep proxy for low power sleeping devicesCISCO TECH INC·Filed 2017·Granted Mar 19, 2019·2 cites·18 claims
- 0562US11257560B2Test architecture for die to die interconnect for three dimensional integrated circuitsINTEL CORP·Filed 2017·Granted Feb 22, 2022·1 cites·9 claims
- 0655US2025004046A1Methods, apparatus, and articles of manufacture to perform infield testing of a system in a packageINTEL CORP·Filed 2024·Application pending·0 cites
- 0754US2025172611A1Predictive and adaptive infield testing based on silicon health informationINTEL CORP·Filed 2023·Application pending·0 cites
- 0854US2025052809A1Device, method and system for in-field lane testing and repair with a three-dimensional integrated circuitINTEL CORP·Filed 2023·Application pending·0 cites
- 0954US2025383400A1Flexible pattern testing for d2d link pathsINTEL CORP·Filed 2024·Application pending·0 cites
- 1052US2025218527A1Memory built-in self-test (mbist) and bist adaptive port (bap) for periodic in-field testingINTEL CORP·Filed 2023·Application pending·0 cites
- 1152US2025110175A1Method and apparatus to detect computing system hardware defects using a portable storage deviceINTEL CORP·Filed 2023·Application pending·0 cites
- 1250US2024103077A1Method and apparatus for accessing remote test data registersINTEL CORP·Filed 2022·Application pending·0 cites
- 1350US2024385946A1Sensor-based control for debug invasivenessINTEL CORP·Filed 2023·Application pending·0 cites
- 1450US2024110975A1Secure Remote DebuggingINTEL CORP·Filed 2022·Application pending·0 cites
- 1548US2024027516A1Test and repair of interconnects between chipsCHAKRAVARTY SREEJIT·Filed 2022·Application pending·0 cites
- 1648US2024264231A1Techniques for infield testing of cryptographic circuitryINTEL CORP·Filed 2023·Application pending·0 cites
- 1748US2025111113A1Generating synthesizable register transfer level designsINTEL CORP·Filed 2023·Application pending·0 cites
- 1848US2024103079A1Infield periodic device testing while maintaining host connectivityINTEL CORP·Filed 2022·Application pending·0 cites
- 1947US2024220312A1Intelligent sensors for high quality silicon life cycle management and efficient infield testingINTEL CORP·Filed 2022·Application pending·0 cites
- 2047US2024427975A1Methods, systems, apparatus, and articles of manufacture to validate timing constraints for an integrated circuitINTEL CORP·Filed 2023·Application pending·0 cites
- 2143US2023084463A1Runtime non-destructive memory built-in self-test (bist)INTEL CORP·Filed 2022·Application pending·0 cites
- 2243US2024329130A1Infield test and debugKANDULA RAKESH·Filed 2023·Application pending·0 cites
- 2340US2024219462A1Techniques for debug, survivability, and infield testing of a system-on-a-chip or a system-on-a-packageINTEL CORP·Filed 2022·Application pending·0 cites
- 2440US2021377221A1Systems and Methods for Costing In Nodes after Policy Plane ConvergenceCISCO TECH INC·Filed 2020·Application pending·0 cites
- 2537US10868876B2Authenticated service discovery using a secure ledgerCISCO TECH INC·Filed 2018·Granted Dec 15, 2020·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →