Inventor · disambiguated record
David L. Demaris
Also filed as: DEMARIS DAVID · DEMARIS DAVID L
12 granted patents·2 pending applications·80 citations·filing 2003–2013
89Inventor score
Top patents by PatentIndex Score
14 records- 0192US7353472B2System and method for testing pattern sensitive algorithms for semiconductor designIBM·Filed 2005·Granted Apr 1, 2008·14 cites·10 claims
- 0291US8863044B1Layout assessment method and systemIBM·Filed 2013·Granted Oct 14, 2014·39 cites·19 claims
- 0371US8234603B2Method for fast estimation of lithographic binding patterns in an integrated circuit layoutBAGHERI SAEED·Filed 2010·Granted Jul 31, 2012·3 cites·25 claims
- 0469US7404174B2method for generating a set of test patterns for an optical proximity correction algorithmIBM·Filed 2004·Granted Jul 22, 2008·11 cites·7 claims
- 0567US8751980B2Automatic wafer data sample planning and reviewIBM·Filed 2012·Granted Jun 10, 2014·1 cites·18 claims
- 0667US7415695B2System for search and analysis of systematic defects in integrated circuitsIBM·Filed 2007·Granted Aug 19, 2008·3 cites·19 claims
- 0764US8201132B2System and method for testing pattern sensitive algorithms for semiconductor designDEMARIS DAVID L·Filed 2009·Granted Jun 12, 2012·1 cites·8 claims
- 0863US8667427B2Method of optimization of a manufacturing process of an integrated circuit layoutDEMARIS DAVID L·Filed 2012·Granted Mar 4, 2014·1 cites·15 claims
- 0963US8661370B2Optimization of a manufacturing process of an integrated circuit layoutDEMARIS DAVID L·Filed 2012·Granted Feb 25, 2014·1 cites·16 claims
- 1060US7284230B2System for search and analysis of systematic defects in integrated circuitsIBM·Filed 2003·Granted Oct 16, 2007·6 cites·21 claims
- 1156US7685544B2Testing pattern sensitive algorithms for semiconductor designIBM·Filed 2007·Granted Mar 23, 2010·0 cites·10 claims
- 1250US7552417B2System for search and analysis of systematic defects in integrated circuitsIBM·Filed 2008·Granted Jun 23, 2009·0 cites·7 claims
- 1350US2008247633A1System for generating a set of test patterns for an optical proximity correction algorithmDEMARIS DAVID L·Filed 2008·Application pending·0 cites
- 1443US2008320421A1Feature extraction that supports progressively refined search and classification of patterns in a semiconductor layoutDEMARIS DAVID L·Filed 2007·Application pending·0 cites
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