Inventor · disambiguated record

E. Howick

Also filed as: HOWICK E KEITH · HOWICK JR E KEITH

1 granted patent·2 pending applications·34 citations·filing 2001–2003

47Inventor score

Technology areasG06F

Files withSILICON METRICS CORP2

Top patents by PatentIndex Score

3 records

0176US6584598B2Apparatus for optimized constraint characterization with degradation options and associated methodsSILICON METRICS CORP·Filed 2001·Granted Jun 24, 2003·34 cites·24 claims
0238US2003212964A1Apparatus for optimized constraint characterization with degradation options and associated methodsSILICON METRICS CORP·Filed 2003·Application pending·0 cites
0332US2002143516A1Apparatus and methods for constraint characterization with degradation optionsFiled 2001·Application pending·0 cites

Join the waitlist — get patent alerts

Get an alert when E. Howick files or is granted a new patent.

We store only your email — no account needed. See our privacy policy.

Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →