Inventor · disambiguated record
Shinichiro Takase
Also filed as: TAKASE SHINICHIRO
3 granted patents·1 pending application·4 citations·filing 2008–2010
55Inventor score
Technology areasG01R
Top patents by PatentIndex Score
4 records- 0167US8310257B2Contact structure for inspectionTAKASE SHINICHIRO·Filed 2010·Granted Nov 13, 2012·3 cites·18 claims
- 0244US8415964B2Probe card having a structure for being prevented from deformingYONEZAWA TOSHIHIRO·Filed 2008·Granted Apr 9, 2013·1 cites·8 claims
- 0337US2011006799A1Method for manufacturing probe supporting plate, computer storage medium and probe supporting plateTOKYO ELECTRON LTD·Filed 2009·Application pending·0 cites
- 0435US8319511B2Probe device having a structure for being prevented from deformingYONEZAWA TOSHIHIRO·Filed 2008·Granted Nov 27, 2012·0 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →