Inventor · disambiguated record
Il Nam
Also filed as: NAM IL · NAM IL-HWAN
3 granted patents·4 citations·filing 2008–2014
56Inventor score
Top patents by PatentIndex Score
3 records- 0172US9255789B2Method for measuring thickness of objectSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Feb 9, 2016·3 cites·20 claims
- 0254US8302373B2Method of assembling filaments and bundle of filaments obtained by the methodLEE CHANG-BAE·Filed 2008·Granted Nov 6, 2012·1 cites·8 claims
- 0352US8511054B2Method of assembling filaments and bundle of filaments obtained by the methodLEE CHANG-BAE·Filed 2012·Granted Aug 20, 2013·0 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →