Inventor · disambiguated record
Moshe Langer
Also filed as: LANGER MOSHE
9 granted patents·1 pending application·105 citations·filing 1991–2023
86Inventor score
Files withAPPLIED MATERIALS ISRAEL LTD3VAYAVISION SENSING LTD3LANGER MOSHE2ISRAEL ATOMIC ENERGY COMM1
Top patents by PatentIndex Score
10 records- 0187US9046475B2High electron energy based overlay error measurement methods and systemsLANGER MOSHE·Filed 2011·Granted Jun 2, 2015·17 cites·19 claims
- 0284US11292483B2Managing a change in a physical property of a vehicle due to an external objectVAYAVISION SENSING LTD·Filed 2019·Granted Apr 5, 2022·5 cites·14 claims
- 0384US5208417AMethod and system for aiming a small caliber weaponISRAEL ATOMIC ENERGY COMM·Filed 1991·Granted May 4, 1993·66 cites·12 claims
- 0479US7973919B2High resolution wafer inspection systemAPPLIED MATERIALS ISRAEL LTD·Filed 2010·Granted Jul 5, 2011·3 cites·4 claims
- 0578US8819111B2Method and system for notifying an addressee of a communication sessionLANGER MOSHE·Filed 2008·Granted Aug 26, 2014·11 cites·16 claims
- 0677US11668830B1System and method for performing active distance measurementsVAYAVISION SENSING LTD·Filed 2019·Granted Jun 6, 2023·3 cites·39 claims
- 0774US12399280B2System and method for performing active distance measurementsVAYAVISION SENSING LTD·Filed 2023·Granted Aug 26, 2025·0 cites·19 claims
- 0856US7714999B2High resolution wafer inspection systemAPPLIED MATERIALS ISRAEL LTD·Filed 2007·Granted May 11, 2010·0 cites·25 claims
- 0939US2003032433A1Resource management in cellular networksFiled 2001·Application pending·0 cites
- 1038US7518391B2Probe card and a method for detecting defects using a probe card and an additional inspectionAPPLIED MATERIALS ISRAEL LTD·Filed 2005·Granted Apr 14, 2009·0 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →