Inventor · disambiguated record
Hyung Suck Cho
Also filed as: CHO HYUNG-SUCK
8 granted patents·1 pending application·168 citations·filing 1996–2008
88Inventor score
Top patents by PatentIndex Score
9 records- 0188US7548324B2Three-dimensional shape measurement apparatus and method for eliminating 2π ambiguity of moire principle and omitting phase shifting meansKOREA ADVANCED INST SCI & TECH·Filed 2007·Granted Jun 16, 2009·14 cites·6 claims
- 0279US6459092B26 degree-of-freedom (DOF) motion measuring apparatusKOREA ADVANCED INST SCI & TECH·Filed 2001·Granted Oct 1, 2002·17 cites·17 claims
- 0377US5850146AProbe apparatus for electrical inspection of printed circuit board assemblySAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Dec 15, 1998·48 cites·7 claims
- 0472US6678059B2Apparatus for measuring 6-degree-of-freedom motions of rigid body by using three-facet mirrorKOREA ADVANCED INST SCI & TECH·Filed 2001·Granted Jan 13, 2004·37 cites·3 claims
- 0569US6349604B1Parallel type six-axes force-moment measuring apparatusSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Feb 26, 2002·33 cites·11 claims
- 0668US6393930B1Ball screw with inner ball circulation and linear actuator equipped with the ball screwKOREA ADVANCED INST SCIENCE AN·Filed 2000·Granted May 28, 2002·12 cites·5 claims
- 0754US7480061B23D shape measurement apparatus and method using stereo moiré techniqueKOREA ADVANCED INST SCI & TECH·Filed 2007·Granted Jan 20, 2009·2 cites·5 claims
- 0850US2008279458A1Imaging system for shape measurement of partially-specular object and method thereofKOREA ADVANCED INST SCI & TECH·Filed 2008·Application pending·0 cites
- 0940US6415014B1Three-dimensional image constructing method using X-ray apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Jul 2, 2002·5 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →