Inventor · disambiguated record
Kun-Up Kim
Also filed as: KIM KUN-UP
3 granted patents·17 citations·filing 2005–2009
67Inventor score
Files withSAMSUNG ELECTRONICS CO LTD3
Top patents by PatentIndex Score
3 records- 0179US7612573B2Probe sensing pads and methods of detecting positions of probe needles relative to probe sensing padsSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Nov 3, 2009·10 cites·48 claims
- 0268US7616020B2Probe pad, substrate having a semiconductor device, method of testing a semiconductor device and tester for testing a semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Nov 10, 2009·5 cites·52 claims
- 0355US7880493B2Probe pad, substrate having a semiconductor device, method of testing a semiconductor device and tester for testing a semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2009·Granted Feb 1, 2011·2 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →