Inventor · disambiguated record
Tetsuya Tanabe
Also filed as: TANABE TETSUYA
60 granted patents·11 pending applications·539 citations·filing 1994–2021
98Inventor score
Top patents by PatentIndex Score
71 records- 0196US7178234B2Method of manufacturing multi-layer printed circuit boardIBIDEN CO LTD·Filed 2005·Granted Feb 20, 2007·44 cites·7 claims
- 0295US9068944B2Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detectionOLYMPUS CORP·Filed 2013·Granted Jun 30, 2015·18 cites·33 claims
- 0393US6930258B1Multilayer printed wiring board and method of producing multilayer printed wiring boardIBIDEN CO LTD·Filed 2000·Granted Aug 16, 2005·57 cites·2 claims
- 0492US8471220B2Optical analysis device, optical analysis method and computer program for optical analysisYAMAGUCHI MITSUSHIRO·Filed 2012·Granted Jun 25, 2013·13 cites·24 claims
- 0590US5659258ALevel shifter circuitOKI ELECTRIC IND CO LTD·Filed 1994·Granted Aug 19, 1997·62 cites·22 claims
- 0689US8541759B2Optical analysis device, optical analysis method and computer program for optical analysisYAMAGUCHI MITSUSHIRO·Filed 2012·Granted Sep 24, 2013·8 cites·24 claims
- 0788US9751393B2Saddle type vehicleHONDA MOTOR CO LTD·Filed 2014·Granted Sep 5, 2017·8 cites·19 claims
- 0888US5596521ASemiconductor memory with built-in cacheOKI ELECTRIC IND CO LTD·Filed 1994·Granted Jan 21, 1997·51 cites·31 claims
- 0987US8710413B2Optical analysis device, optical analysis method and computer program for optical analysisYAMAGUCHI MITSUSHIRO·Filed 2012·Granted Apr 29, 2014·6 cites·26 claims
- 1086US9329117B2Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detectionOLYMPUS CORP·Filed 2014·Granted May 3, 2016·6 cites·12 claims
- 1183US7999194B2Multi-layer printed circuit board and method of manufacturing multi-layer printed circuit boardIBIDEN CO LTD·Filed 2008·Granted Aug 16, 2011·7 cites·12 claims
- 1280US8680485B2Optical analysis method using the detection of a single light-emitting particleOLYMPUS CORP·Filed 2013·Granted Mar 25, 2014·3 cites·10 claims
- 1380US8681332B2Method of measuring a diffusion characteristic value of a particleOLYMPUS CORP·Filed 2013·Granted Mar 25, 2014·3 cites·7 claims
- 1479US9395357B2Method of detecting sparse particles in a solution using a light-emitting probeOLYMPUS CORP·Filed 2013·Granted Jul 19, 2016·4 cites·17 claims
- 1579US8803106B2Optical analysis device, optical analysis method and computer program for optical analysis for observing polarization characteristics of a single light-emitting particleOLYMPUS CORP·Filed 2013·Granted Aug 12, 2014·3 cites·26 claims
- 1678US8785886B2Optical analysis method using the light intensity of a single light-emitting particleOLYMPUS CORP·Filed 2013·Granted Jul 22, 2014·3 cites·10 claims
- 1777US6195771B1Semiconductor device having semiconductor memory circuit to be tested, method of testing semiconductor memory circuit and read circuit for semiconductor memory circuitOKI ELECTRIC IND CO LTD·Filed 1997·Granted Feb 27, 2001·41 cites·23 claims
- 1875US9423349B2Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detectionOLYMPUS CORP·Filed 2014·Granted Aug 23, 2016·3 cites·27 claims
- 1975US7795542B2Multi-layer printed circuit board and method of manufacturing multi-layer printed circuit boardIBIDEN CO LTD·Filed 2006·Granted Sep 14, 2010·5 cites·17 claims
- 2074US9528923B2Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detectionOLYMPUS CORP·Filed 2014·Granted Dec 27, 2016·2 cites·27 claims
- 2174US6868021B2Rapidly testable semiconductor memory deviceOKI ELECTRIC IND CO LTD·Filed 2003·Granted Mar 15, 2005·23 cites·19 claims
- 2273US8024155B2Sample data reliability evaluation method and sample data reliability evaluation apparatusOLYMPUS CORP·Filed 2009·Granted Sep 20, 2011·2 cites·8 claims
- 2371US6441665B1Semiconductor integrated circuitOKI ELECTRIC IND CO LTD·Filed 2000·Granted Aug 27, 2002·16 cites·14 claims
- 2470US9494779B2Optical analysis device, optical analysis method and computer program for optical analysis using single particle detectionOLYMPUS CORP·Filed 2014·Granted Nov 15, 2016·2 cites·20 claims
- 2570US6320778B1Semiconductor memory with built-in cacheOKI ELECTRIC IND CO LTD·Filed 2001·Granted Nov 20, 2001·12 cites·4 claims
- 2669US5577223ADynamic random access memory (DRAM) with cache and tagOKI ELECTRIC IND CO LTD·Filed 1994·Granted Nov 19, 1996·48 cites·16 claims
- 2764US9488578B2Single particle detection device, single particle detection method, and computer program for single particle detection, using optical analysisOLYMPUS CORP·Filed 2014·Granted Nov 8, 2016·1 cites·33 claims
- 2861US7846696B2Method for estimating target nucleic acid ratioOLYMPUS CORP·Filed 2009·Granted Dec 7, 2010·0 cites·18 claims
- 2959US6522563B2Semiconductor memory with built-in cacheOKI ELECTRIC IND CO LTD·Filed 2002·Granted Feb 18, 2003·7 cites·4 claims
- 3059US2009075285A1Primer kitOLYMPUS CORP·Filed 2008·Application pending·0 cites
- 3159US2011117547A1Target dna detection method and target dna detection kitOLYMPUS CORP·Filed 2008·Application pending·0 cites
- 3258US5781466ASemiconductor memory with built-in cacheOKI ELECTRIC IND CO LTD·Filed 1996·Granted Jul 14, 1998·13 cites·25 claims
- 3357US8530165B2Nucleic acid detection method for determining if one or more analyte nucleotides are present in a nucleic acidTANABE TETSUYA·Filed 2009·Granted Sep 10, 2013·0 cites·14 claims
- 3456US8106310B2Multi-layer printed circuit board and method of manufacturing multi-layer printed circuit boardKAWASAKI YOGO·Filed 2009·Granted Jan 31, 2012·1 cites·17 claims
- 3556US2009061440A1Method for amplifying plural nucleic acid sequences for discriminationOLYMPUS CORP·Filed 2008·Application pending·0 cites
- 3653US8236498B2Method of detecting nucleotide sequence with an intramolecular probeTANABE TETSUYA·Filed 2008·Granted Aug 7, 2012·0 cites·42 claims
- 3753US6362989B2Semiconductor memory with built-in cacheOKI ELECTRIC IND CO LTD·Filed 2001·Granted Mar 26, 2002·5 cites·4 claims
- 3853US5648734ABuffer circuit and bias circuitOKI ELECTRIC IND CO LTD·Filed 1995·Granted Jul 15, 1997·11 cites·15 claims
- 3951US2016252456A1Single particle detection device, single particle detection method, and computer program for single particle detection, using optical analysisOLYMPUS CORP·Filed 2016·Application pending·0 cites
- 4051US2022101568A1Image generation system, image generation method, and non-transitory computer-readable storage mediumOLYMPUS CORP·Filed 2021·Application pending·0 cites
- 4149US11893559B2Unit mounting structure and electronic apparatusNEC PLATFORMS LTD·Filed 2020·Granted Feb 6, 2024·0 cites·20 claims
- 4249US9863806B2Optical analysis method and optical analysis device using the detection of light from a single light-emitting particleOLYMPUS CORP·Filed 2013·Granted Jan 9, 2018·0 cites·8 claims
- 4349US9103718B2Optical analysis device and optical analysis method using a wavelength characteristic of light of a single light-emitting particleOLYMPUS CORP·Filed 2013·Granted Aug 11, 2015·0 cites·12 claims
- 4449US8958066B2Optical analysis method using measurement of light of two or more wavelength bandsOLYMPUS CORP·Filed 2013·Granted Feb 17, 2015·0 cites·15 claims
- 4549US8822839B2Multi-layer printed circuit board and method of manufacturing multi-layer printed circuit boardKAWASAKI YOGO·Filed 2011·Granted Sep 2, 2014·0 cites·20 claims
- 4649US5477496ASemiconductor memory device having circuits for precharging and equalizingOKI ELECTRIC IND CO LTD·Filed 1995·Granted Dec 19, 1995·9 cites·12 claims
- 4748US11119022B2Optical analysis device, optical analysis method, and recording mediumOLYMPUS CORP·Filed 2019·Granted Sep 14, 2021·0 cites·20 claims
- 4848US9435727B2Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detectionOLYMPUS CORP·Filed 2013·Granted Sep 6, 2016·0 cites·21 claims
- 4947US2014131593A1Method for detecting fluorescent particlesOLYMPUS CORP·Filed 2014·Application pending·0 cites
- 5046US11921577B2Semiconductor storage element, semiconductor storage device and system-on-chipLAPIS SEMICONDUCTOR CO LTD·Filed 2021·Granted Mar 5, 2024·0 cites·6 claims
Showing the top 50 of 71 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →