Inventor · disambiguated record
Kunihiko Hatsushika
Also filed as: HATSUSHIKA KUNIHIKO
3 granted patents·39 citations·filing 2004–2007
71Inventor score
Technology areasH10P
Top patents by PatentIndex Score
3 records- 0186US7091733B2Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test methodIBIDEN CO LTD·Filed 2004·Granted Aug 15, 2006·30 cites·20 claims
- 0282US7242206B2Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test methodIBIDEN CO LTD·Filed 2005·Granted Jul 10, 2007·7 cites·43 claims
- 0367US8456186B2Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test methodTAKEKOSHI KIYOSHI·Filed 2007·Granted Jun 4, 2013·2 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →