Inventor · disambiguated record
Toshio Akatsu
Also filed as: AKATSU TOSHIO
11 granted patents·213 citations·filing 1979–1996
92Inventor score
Files withHITACHI LTD11
Top patents by PatentIndex Score
11 records- 0182US4724301AApparatus utilizing light stripe image for detecting portion to be welded prior to welding thereofHITACHI LTD·Filed 1986·Granted Feb 9, 1988·31 cites·17 claims
- 0281US4667997AGrip deviceHITACHI LTD·Filed 1985·Granted May 26, 1987·43 cites·12 claims
- 0372US4984891ALaser gauge interferometer and locating method using the sameHITACHI LTD·Filed 1989·Granted Jan 15, 1991·31 cites·18 claims
- 0472US4667082AWelding position detecting apparatusHITACHI LTD·Filed 1985·Granted May 19, 1987·21 cites·14 claims
- 0565US5392173AMethod and apparatus for controlling a small spacing between a magnetic head and a magnetic recording mediumHITACHI LTD·Filed 1993·Granted Feb 21, 1995·16 cites·18 claims
- 0660US5675415APhysical quantity measurement apparatus and instrument thereforHITACHI LTD·Filed 1995·Granted Oct 7, 1997·21 cites·16 claims
- 0752US4708481AMethod of and apparatus for optically measuring displacementHITACHI LTD·Filed 1986·Granted Nov 24, 1987·13 cites·21 claims
- 0851US5929989AOptical pressure detection method and apparatusHITACHI LTD·Filed 1996·Granted Jul 27, 1999·15 cites·8 claims
- 0945US4248095AMethod of and system for measuring physical quantities of a rotating body at many points thereofHITACHI LTD·Filed 1979·Granted Feb 3, 1981·8 cites·9 claims
- 1041US4632556AMethod and apparatus for optically measuring clearance changeHITACHI LTD·Filed 1983·Granted Dec 30, 1986·7 cites·9 claims
- 1139US4728194AMethod of and apparatus for optically measuring displacementHITACHI LTD·Filed 1986·Granted Mar 1, 1988·7 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →