Inventor · disambiguated record
Ritesh P. Turakhia
Also filed as: TURAKHIA RITESH P
2 granted patents·5 citations·filing 2004–2008
48Inventor score
Technology areasG01R
Top patents by PatentIndex Score
2 records- 0161US8352818B2Method for generating test patterns for small delay defectsLSI CORP·Filed 2008·Granted Jan 8, 2013·4 cites·22 claims
- 0236US7171638B2Methods of screening ASIC defects using independent component analysis of quiescent current measurementsLSI LOGIC CORP·Filed 2004·Granted Jan 30, 2007·1 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →