Inventor · disambiguated record
Hiroki Shimano
Also filed as: SHIMANO HIROKI
59 granted patents·4 pending applications·2,080 citations·filing 1986–2018
99Inventor score
Files withMITSUBISHI ELECTRIC CORP34RENESAS TECH CORP16SHIMANO HIROKI7RENESAS ELECTRONICS CORP2RENESES TECHNOLOGY CORP1
Top patents by PatentIndex Score
63 records- 0198US8274841B2Semiconductor signal processing deviceSHIMANO HIROKI·Filed 2012·Granted Sep 25, 2012·413 cites·10 claims
- 0298US6449204B1Dynamic semiconductor memory device capable of rearranging data storage from a one bit/one cell scheme in a normal mode to a one bit/two cell scheme in a twin-cell mode for lengthening a refresh intervalMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Sep 10, 2002·190 cites·29 claims
- 0396US7738312B2Semiconductor memory deviceRENESAS TECH CORP·Filed 2007·Granted Jun 15, 2010·53 cites·25 claims
- 0496US7139208B2Refresh-free dynamic semiconductor memory deviceRENESAS TECH CORP·Filed 2005·Granted Nov 21, 2006·40 cites·6 claims
- 0596US6452859B1Dynamic semiconductor memory device superior in refresh characteristicsMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Sep 17, 2002·122 cites·35 claims
- 0695US8130582B2Semiconductor signal processing deviceSHIMANO HIROKI·Filed 2009·Granted Mar 6, 2012·35 cites·28 claims
- 0793US6785157B2Semiconductor memory device having a memory cell structure of reduced occupying areaRENESAS TECH CORP·Filed 2002·Granted Aug 31, 2004·55 cites·20 claims
- 0892US6414890B2Semiconductor memory device capable of reliably performing burn-in test at wafer levelMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Jul 2, 2002·64 cites·16 claims
- 0992US6400625B2Semiconductor integrated circuit device capable of performing operational test for contained memory core at operating frequency higher than that of memory testerMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Jun 4, 2002·66 cites·13 claims
- 1092US6388929B1Semiconductor memory device performing redundancy repair based on operation test and semiconductor integrated circuit device having the sameMITSUBISHI ELECTRIC CORP·Filed 2001·Granted May 14, 2002·71 cites·18 claims
- 1189US10371582B2Signal generation circuit and temperature sensorRENESAS ELECTRONICS CORP·Filed 2018·Granted Aug 6, 2019·3 cites·6 claims
- 1289US7480168B2Semiconductor memory deviceRENESAS TECH CORP·Filed 2007·Granted Jan 20, 2009·11 cites·9 claims
- 1389US6807077B2Content addressable memory capable of stably storing ternary dataRENESAS TECH CORP·Filed 2003·Granted Oct 19, 2004·52 cites·10 claims
- 1489US6067260ASynchronous semiconductor memory device having redundant circuit of high repair efficiency and allowing high speed accessMITSUBISHI ELECTRIC CORP·Filed 1998·Granted May 23, 2000·69 cites·12 claims
- 1588US7626883B2Semiconductor memory deviceRENESAS TECH CORP·Filed 2008·Granted Dec 1, 2009·21 cites·8 claims
- 1688US6925022B2Refresh-free dynamic semiconductor memory deviceRENESAS TECH CORP·Filed 2002·Granted Aug 2, 2005·36 cites·7 claims
- 1787US6781915B2Semiconductor memory deviceRENESAS TECH CORP·Filed 2002·Granted Aug 24, 2004·48 cites·11 claims
- 1887US6459113B1Semiconductor integrated circuit device and method of manufacturing the same, and cell size calculation method for DRAM memory cellsMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Oct 1, 2002·39 cites·7 claims
- 1987US6418075B2Semiconductor merged logic and memory capable of preventing an increase in an abnormal current during power-upMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Jul 9, 2002·58 cites·9 claims
- 2086US6744684B2Semiconductor memory device with simple refresh controlRENESES TECHNOLOGY CORP·Filed 2001·Granted Jun 1, 2004·44 cites·12 claims
- 2185US7248495B2Semiconductor memory deviceRENESAS TECH CORP·Filed 2006·Granted Jul 24, 2007·8 cites·4 claims
- 2284US6636454B2Low-power consumption semiconductor memory deviceMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Oct 21, 2003·28 cites·8 claims
- 2384US6404684B2Test interface circuit and semiconductor integrated circuit device including the sameMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Jun 11, 2002·35 cites·19 claims
- 2480US6646944B2Semiconductor memory deviceMITSUBISHI ELECTRIC CORP·Filed 2002·Granted Nov 11, 2003·28 cites·18 claims
- 2580US6163488ASemiconductor device with antifuseMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Dec 19, 2000·43 cites·17 claims
- 2679US6898137B2Semiconductor memory device with high-speed sense amplifierRENESAS TECH CORP·Filed 2003·Granted May 24, 2005·26 cites·14 claims
- 2779US6331956B1Synchronous semiconductor memory device having redundant circuit of high repair efficiency and allowing high speed accessMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Dec 18, 2001·23 cites·3 claims
- 2878US8237836B2Solid-state image sensor device and differential interface thereofSHIMANO HIROKI·Filed 2009·Granted Aug 7, 2012·4 cites·13 claims
- 2978US5164806AElement isolating structure of semiconductor device suitable for high density integrationMITSUBISHI ELECTRIC CORP·Filed 1991·Granted Nov 17, 1992·68 cites·11 claims
- 3077US6909658B2Semiconductor memory device with row selection control circuitRENESAS TECH CORP·Filed 2004·Granted Jun 21, 2005·20 cites·5 claims
- 3177US6456560B2Semiconductor integrated circuit device with test interface circuit for performing test on embedded memory from outsideMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Sep 24, 2002·23 cites·13 claims
- 3275US7046543B2Semiconductor memory device with improved data retention characteristicsRENESAS TECH CORP·Filed 2004·Granted May 16, 2006·13 cites·6 claims
- 3375US6178122B1Boosted-voltage drive circuit operable with high reliability and semiconductor memory device employing the sameMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Jan 23, 2001·31 cites·10 claims
- 3474US6486493B2Semiconductor integrated circuit device having hierarchical test interface circuitMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Nov 26, 2002·21 cites·17 claims
- 3574US6483139B1Semiconductor memory device formed on semiconductor substrateMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Nov 19, 2002·21 cites·17 claims
- 3673US9891116B2Signal generation circuit and temperature sensorRENESAS ELECTRONICS CORP·Filed 2014·Granted Feb 13, 2018·2 cites·8 claims
- 3773US6608795B2Semiconductor device including memory with reduced current consumptionMITSUBISHI ELECTRIC CORP·Filed 2002·Granted Aug 19, 2003·17 cites·1 claims
- 3871US6477108B2Semiconductor device including memory with reduced current consumptionMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Nov 5, 2002·16 cites·9 claims
- 3969US6573613B2Semiconductor memory device having cell plate electrodes allowing independent power supply for each redundant replacement unitMITSUBISHI ELECTRIC CORP·Filed 2002·Granted Jun 3, 2003·17 cites·10 claims
- 4067US6804164B2Low-power consumption semiconductor memory deviceRENESAS TECH CORP·Filed 2003·Granted Oct 12, 2004·12 cites·8 claims
- 4165US6545926B2Antifuse address detecting circuit programmable by applying a high voltage and semiconductor integrated circuit device provided with the sameMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Apr 8, 2003·23 cites·25 claims
- 4263US9065443B2Inverter drive deviceSHIMANO HIROKI·Filed 2012·Granted Jun 23, 2015·2 cites·6 claims
- 4363US6597599B2Semiconductor memoryMITSUBISHI ELECTRIC CORP·Filed 2002·Granted Jul 22, 2003·10 cites·6 claims
- 4460US6327195B2Boosted-voltage drive circuit operable with high reliability and semiconductor memory device employing the sameMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Dec 4, 2001·9 cites·4 claims
- 4560US6058053ASemiconductor memory device capable of high speed operation and including redundant cellsMITSUBISHI ELECTRIC CORP·Filed 1998·Granted May 2, 2000·19 cites·17 claims
- 4659US6377483B1Semiconductor memory device having improved memory cell and bit line pitchMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Apr 23, 2002·10 cites·10 claims
- 4756US8462251B2Solid-state image sensor device and differential interface thereofSHIMANO HIROKI·Filed 2012·Granted Jun 11, 2013·0 cites·3 claims
- 4855US2009103353A1Semiconductor memory deviceRENESAS TECH CORP·Filed 2008·Application pending·0 cites
- 4954US6400628B2Semiconductor memory deviceMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Jun 4, 2002·5 cites·11 claims
- 5054US4702797AMethod of manufacturing semiconductor memory deviceMITSUBISHI ELECTRIC CORP·Filed 1986·Granted Oct 27, 1987·16 cites·8 claims
Showing the top 50 of 63 patent records by PatentIndex Score.
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