Inventor · disambiguated record

Keng-Yuan Wu

Also filed as: WU KENG-YUAN

1 granted patent·4 citations·filing 1999–1999

24Inventor score

Technology areasG01N

Files withUNITED MICROELECTRONICS CORP1

Top patents by PatentIndex Score

1 record

0131US6014223AMethod of determining the impurity concentration of impurity-doped polysilicon in semiconductor wafersUNITED MICROELECTRONICS CORP·Filed 1999·Granted Jan 11, 2000·4 cites·4 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →