Inventor · disambiguated record

Yu-Hsi Lee

Also filed as: LEE YU-HSI

1 granted patent·1 pending application·2 citations·filing 2010–2011

18Inventor score

Technology areasG01N H10P

Files withCHANG JEN-MING1 CHOU YEN-CHUN1

Top patents by PatentIndex Score

2 records

0160US8396281B2Apparatus and method for inspecting substrate internal defectsCHANG JEN-MING·Filed 2010·Granted Mar 12, 2013·2 cites·6 claims
0230US2012044346A1Apparatus and method for inspecting internal defect of substrateCHOU YEN-CHUN·Filed 2011·Application pending·0 cites

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →